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2024 IEEE International Reliability Physics Symposium (IRPS) ,
5
Effect of Back Gate on Word Line Disturb Immunity of a Vert..:
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2023 International Electron Devices Meeting (IEDM) ,
6
Self-Aligned in 2Pitch Cell Array Transistor (S2CAT) for 4F..:
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2023 IEEE International Reliability Physics Symposium (IRPS) ,
8
Enhanced DRAM Single Bit Characteristics from Process Contr..:
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2023 IEEE International Reliability Physics Symposium (IRPS) ,
9
Investigation of Sub-20nm 4th generation DRAM cell transist..:
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2023 IEEE International Reliability Physics Symposium (IRPS) ,
10
Investigation on NBTI Control Techniques of HKMG Transistor..:
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2023 IEEE International Reliability Physics Symposium (IRPS) ,
12
Analysis of Intermittent Single-bit Failure on 10-nm node g..:
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2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ,
15