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2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
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Thermal simulations of lock-in-thermography for failure ana..:
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2023 IEEE Nanotechnology Materials and Devices Conference (NMDC) ,
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Electrical Stress Induced Breakdown and Post Breakdown Phys..:
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2023 IEEE International Integrated Reliability Workshop (IIRW) ,
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Reliability Analysis of Random Telegraph Noisebased True Ra..:
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2023 IEEE International Reliability Physics Symposium (IRPS) ,
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