I agree that this site is using cookies. You can find further informations
here
.
X
Login
My folder (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
Show Desktop-Version
Toggle navigation
Taur, Yuan
43
results:
Online X
Search for persons
X
Format
Online (43)
Mediatypes
Articles (Online) (32)
Bookchapter (Online) (1)
OpenAccess-fulltext (10)
Sorted by: Relevance
Sorted by: Year
?
1
Modeling of Electrostatics and Currents in a Forward-Biased..:
Lin, Kuan-Wun
;
Taur, Yuan
IEEE Transactions on Electron Devices. , 2024
Link:
https://doi.org/10.1109/..
?
2
A non-GCA model for ground-plane MOSFETs:
Su, Meihua
;
Hong, Chuyang
;
Taur, Yuan
Solid-State Electronics. 209 (2023) - p. 108754 , 2023
Link:
https://doi.org/10.1016/..
?
3
On the Log-Linear Inversion-Charge Relation for MOSFET Mode..:
Taur, Yuan
IEEE Transactions on Electron Devices. 69 (2022) 1 - p. 427-429 , 2022
Link:
https://doi.org/10.1109/..
?
4
Effects of BOX thickness, silicon thickness, and backgate b..:
Su, Elizabeth Mei-hua
;
Hong, David Chuyang
;
Cristoloveanu, Sorin
.
Microelectronic Engineering. 238 (2021) - p. 111506 , 2021
Link:
https://doi.org/10.1016/..
?
5
Non-GCA modeling of near threshold I-V characteristics of D..:
Ren, Zhongjie
;
Taur, Yuan
Solid-State Electronics. 166 (2020) - p. 107766 , 2020
Link:
https://doi.org/10.1016/..
?
6
Engineering High-k/SiGe Interface with ALD Oxide for Select..:
Kavrik, Mahmut S.
;
Ercius, Peter
;
Cheung, Joanna
...
ACS Applied Materials & Interfaces. 11 (2019) 16 - p. 15111-15121 , 2019
Link:
https://doi.org/10.1021/..
?
7
Understanding the Mechanism of Electronic Defect Suppressio..:
Kavrik, Mahmut Sami
;
Bostwick, Aaron
;
Rotenberg, Eli
...
Journal of the American Chemical Society. 142 (2019) 1 - p. 134-145 , 2019
Link:
https://doi.org/10.1021/..
?
8
Ultralow Defect Density at Sub-0.5 nm HfO2/SiGe Interfaces ..:
Kavrik, Mahmut S.
;
Thomson, Emily
;
Chagarov, Evgueni
...
ACS Applied Materials & Interfaces. 10 (2018) 36 - p. 30794-30802 , 2018
Link:
https://doi.org/10.1021/..
?
9
Insight into carrier lifetime impact on band-modulation dev..:
Parihar, Mukta Singh
;
Lee, Kyung Hwa
;
Park, Hyung Jin
...
Solid-State Electronics. 143 (2018) - p. 41-48 , 2018
Link:
https://doi.org/10.1016/..
?
10
A comprehensive model on field-effect pnpn devices (Z 2 -FE..:
Taur, Yuan
;
Lacord, Joris
;
Parihar, Mukta Singh
...
Solid-State Electronics. 134 (2017) - p. 1-8 , 2017
Link:
https://doi.org/10.1016/..
?
11
Characterization of interface defects in ALD Al 2 O 3 /p-Ga..:
Gu, Siyuan
;
Min, Jie
;
Taur, Yuan
.
Solid-State Electronics. 118 (2016) - p. 18-25 , 2016
Link:
https://doi.org/10.1016/..
?
12
Diameter-Independent Hole Mobility in Ge/Si Core/Shell Nano..:
Nguyen, Binh-Minh
;
Taur, Yuan
;
Picraux, S. Tom
.
Nano Letters. 14 (2014) 2 - p. 585-591 , 2014
Link:
https://doi.org/10.1021/..
?
13
Invited talk: CMOS device scaling — Past, present, and futu..:
, In:
2014 IEEE Workshop On Microelectronics And Electron Devices (WMED)
,
Taur, Yuan
- p. 1-1 , 2014
Link:
https://doi.org/10.1109/..
?
14
Determination of energy and spatial distribution of oxide b..:
Dou, Chunmeng
;
Lin, Dennis
;
Vais, Abhitosh
...
Microelectronics Reliability. 54 (2014) 4 - p. 746-754 , 2014
Link:
https://doi.org/10.1016/..
?
15
Re-examination of the extraction of MOS interface-state den..:
Chen, Han-Ping
;
Yuan, Yu
;
Yu, Bo
...
Semiconductor Science and Technology. 28 (2013) 8 - p. 085008 , 2013
Link:
https://doi.org/10.1088/..
1-15