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Anger, Sabrina
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1

Combining Full Wafer Inspection with Deep Learning to Recog..:

, In: 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Anger, Sabrina ; Yayak, Anil Bora ; Roeder, Georg... - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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2

Smart Platform for Rapid Prototyping: A First Solution Appr..:

, In: Lecture Notes in Electrical Engineering; Digital Transformation in Semiconductor Manufacturing,
Schellenberger, Martin ; Anger, Sabrina ; Pfeffer, Markus... - p. 129-135 , 2020
Link: https://doi.org/10.1007/..
 
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3

Contactless electrical defect characterization in semicondu..:

Berger, Bastian ; Schüler, Nadine ; Anger, Sabrina...
physica status solidi (a).  208 (2011)  4 - p. 769-776 , 2011
Link: https://doi.org/10.1002/..
 
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4

Potential and challenges of compound semiconductor characte..:

Anger, Sabrina
urn:nbn:de:bsz:105-qucosa-201487.  , 2016
Link: https://nbn-resolving.or..
 
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5

Potential and challenges of compound semiconductor characte..:

Anger, Sabrina , 2015
Link: http://nbn-resolving.de/..
 
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