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Rathaur, Shivendra
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1

Investigation on Traps Dynamics & Negative Bias Stress in D..:

Rathaur, Shivendra K. ; Hieu, Le Trung ; Yang, Tsung-Ying...
IEEE Transactions on Device and Materials Reliability.  , 2024
Link: https://doi.org/10.1109/..
 
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2

Performance and Threshold Voltage Reliability of Quaternary..:

Rathaur, Shivendra K. ; Ma, Cheng-Jun ; Dixit, Abhisek..
IEEE Transactions on Device and Materials Reliability.  , 2024
Link: https://doi.org/10.1109/..
 
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3

Reliability assessment of high-power GaN-HEMT devices with ..:

Rathaur, Shivendra K. ; Hieu, Le Trung ; Dixit, Abhisek.
Applied Physics Express.  17 (2024)  7 - p. 076501 , 2024
Link: https://doi.org/10.35848..
 
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4

Low contact resistance and high breakdown voltage of AlGaN/..:

Hieu, Le Trung ; Rathaur, Shivendra K ; Lu, Chee-How...
Semiconductor Science and Technology.  39 (2024)  8 - p. 085006 , 2024
Link: https://doi.org/10.1088/..
 
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5

High-Temperature TDDB Investigation on High Performance-Cen..:

Rathaur, Shivendra K. ; Wu, Jui-Sheng ; Yang, Tsung-Ying...
IEEE Transactions on Electron Devices.  70 (2023)  9 - p. 4584-4590 , 2023
Link: https://doi.org/10.1109/..
 
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6

Time-dependent Multiple Gate Voltage Reliability of Hybrid ..:

, In: 2022 IEEE Latin American Electron Devices Conference (LAEDC),
Rathaur, Shivendra K. ; Yang, Tsung-Ying ; Yang, Chih-Yi... - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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7

Metal (Pt)/ferroelectric (SrBi2Ta2O9)/insulator (La2O3)/sem..:

Rathaur, Shivendra K. ; Khosla, Robin ; Sharma, Satinder K.
Applied Physics Letters.  119 (2021)  6 - p. , 2021
Link: https://doi.org/10.1063/..
 
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