Agarwal, Akshay
126  results:
Search for persons X
?
1

Shot noise-mitigated secondary electron imaging with ion co..:

Agarwal, Akshay ; Kasaei, Leila ; He, Xinglin...
Proceedings of the National Academy of Sciences.  121 (2024)  31 - p. , 2024
 
?
2

Ion Count-Aided Microscopy for Quantitative, Shot Noise-Mit..:

Agarwal, Akshay ; Kasaei, Leila ; He, Xinglin...
Microscopy and Microanalysis.  30 (2024)  Supplement_1 - p. , 2024
 
?
5

IBAttack: Being Cautious About Data Labels:

Agarwal, Akshay ; Singh, Richa ; Vatsa, Mayank.
IEEE Transactions on Artificial Intelligence.  4 (2023)  6 - p. 1484-1493 , 2023
 
?
9

Fourier-ring Correlation Resolution for Time-resolved Measu..:

Hitit, Oguz Kagan ; Agarwal, Akshay ; Goyal, Vivek
Microscopy and Microanalysis.  29 (2023)  Supplement_1 - p. 730-731 , 2023
 
?
10

Continuous-Time Modeling and Analysis of Particle Beam Metr..:

Agarwal, Akshay ; Peng, Minxu ; Goyal, Vivek K
IEEE Journal on Selected Areas in Information Theory.  4 (2023)  - p. 61-74 , 2023
 
?
11

Progress in Secondary Electron Yield Mapping in Charged Par..:

Agarwal, Akshay ; Kasaei, Leila ; Schultz, Albert..
Microscopy and Microanalysis.  29 (2023)  Supplement_1 - p. 741-742 , 2023
 
?
 
?
15

Online Beam Current Estimation in Particle Beam Microscopy:

Seidel, Sheila W. ; Watkins, Luisa ; Peng, Minxu...
IEEE Transactions on Computational Imaging.  8 (2022)  - p. 521-535 , 2022
 
1-15