Ball, R
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2

Single-Event Burnout in Vertical β-Ga₂O₃ Diodes With Pt/PtO..:

Islam, S. ; Senarath, A. S. ; Farzana, E....
IEEE Transactions on Nuclear Science.  71 (2024)  4 - p. 515-521 , 2024
 
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Single-Event Upsets for Single-Port and Two-Port SRAM Cells..:

Pieper, N. J. ; Xiong, Y. ; Pasternak, J....
IEEE Transactions on Nuclear Science.  70 (2023)  8 - p. 1673-1679 , 2023
 
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5

Study of Multicell Upsets in SRAM at a 5-nm Bulk FinFET Nod:

Pieper, Nicholas J. ; Xiong, Yoni ; Feeley, Alexandra...
IEEE Transactions on Nuclear Science.  70 (2023)  4 - p. 401-409 , 2023
 
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7

Low-Energy Ion-Induced Single-Event Burnout in Gallium Oxid..:

Cadena, R. M. ; Ball, D. R. ; Zhang, E. X....
IEEE Transactions on Nuclear Science.  70 (2023)  4 - p. 363-369 , 2023
 
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9

Peroxone activated persulfate oxidation of 1,4-Dioxane unde..:

Cashman, M. ; Ball, R. ; Lewis, T..
Journal of Contaminant Hydrology.  245 (2022)  - p. 103937 , 2022
 
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11

SE Performance of D-FF Designs With Different VT Options at..:

Feeley, A. ; Xiong, Y. ; Pieper, N. J...
IEEE Transactions on Nuclear Science.  69 (2022)  7 - p. 1582-1586 , 2022
 
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12

In Situ Measurement of TID-Induced Leakage Using On-Chip Fr..:

Vibbert, S. T. ; Watkins, A. C. ; D'Amico, J. V....
IEEE Transactions on Nuclear Science.  69 (2022)  3 - p. 367-373 , 2022
 
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13

HEXITEC 2 × 2 tiled hard X-ray spectroscopic imaging detect..:

Jowitt, L. ; Wilson, M. ; Seller, P....
Journal of Instrumentation.  17 (2022)  1 - p. P01012 , 2022
 
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14

Mitigating Total-Ionizing-Dose-Induced Threshold-Voltage Sh..:

Watkins, A. C. ; Vibbert, S. T. ; D'Amico, J. V....
IEEE Transactions on Nuclear Science.  69 (2022)  3 - p. 374-380 , 2022
 
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15

The role of illicit drugs in developing medication-related ..:

Sacco, R. ; Ball, R. ; Barry, E..
British Journal of Oral and Maxillofacial Surgery.  59 (2021)  4 - p. 398-406 , 2021
 
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