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Hsieh, Tien-Yu
3829
results:
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1
Retraction notice to "Investigating Degradation Behavior of..:
Hsieh, Tien-Yu
;
Chang, Ting-Chang
;
Chen, Te-Chih
..
Thin Solid Films. 665 (2018) - p. 195 , 2018
Link:
https://doi.org/10.1016/..
?
2
The effect of device electrode geometry on performance afte..:
Liao, Po-Yung
;
Chang, Ting-Chang
;
Chen, Yu-Jia
...
Applied Physics Letters. 110 (2017) 20 - p. , 2017
Link:
https://doi.org/10.1063/..
?
3
Impact of repeated uniaxial mechanical strain on flexible a..:
Liao, Po-Yung
;
Chang, Ting-Chang
;
Su, Wan-Ching
...
Applied Physics Letters. 110 (2017) 26 - p. , 2017
Link:
https://doi.org/10.1063/..
?
4
Publisher's Note: "The effect of asymmetrical electrode for..:
Su, Wan-Ching
;
Chang, Ting-Chang
;
Liao, Po-Yung
...
Applied Physics Letters. 110 (2017) 15 - p. , 2017
Link:
https://doi.org/10.1063/..
?
5
The effect of asymmetrical electrode form after negative bi..:
Su, Wan-Ching
;
Chang, Ting-Chang
;
Liao, Po-Yung
...
Applied Physics Letters. 110 (2017) 10 - p. , 2017
Link:
https://doi.org/10.1063/..
?
6
Effect of mechanical-strain-induced defect generation on th..:
Liao, Po-Yung
;
Chang, Ting-Chang
;
Su, Wan-Ching
...
Applied Physics Express. 9 (2016) 12 - p. 124101 , 2016
Link:
https://doi.org/10.7567/..
?
7
Investigating degradation behavior of hole-trapping effect ..:
Liao, Po-Yung
;
Chang, Ting-Chang
;
Hsieh, Tien-Yu
...
Thin Solid Films. 603 (2016) - p. 359-362 , 2016
Link:
https://doi.org/10.1016/..
?
8
Investigation of carrier transport behavior in amorphous in..:
Liao, Po-Yung
;
Chang, Ting-Chang
;
Hsieh, Tien-Yu
...
Japanese Journal of Applied Physics. 54 (2015) 9 - p. 094101 , 2015
Link:
https://doi.org/10.7567/..
?
9
Impact of repeated uniaxial mechanical strain on p-type fle..:
Chen, Bo-Wei
;
Chang, Ting-Chang
;
Hung, Yu-Ju
...
Applied Physics Letters. 106 (2015) 18 - p. , 2015
Link:
https://doi.org/10.1063/..
?
10
Investigation of on-current degradation behavior induced by..:
Liu, Kuan-Hsien
;
Chang, Ting-Chang
;
Chang, Kuan-Chang
...
Applied Physics Letters. 104 (2014) 10 - p. , 2014
Link:
https://doi.org/10.1063/..
?
11
Review of Present Reliability Challenges in Amorphous In-Ga..:
Hsieh, Tien-Yu
;
Chang, Ting-Chang
;
Chen, Te-Chih
.
ECS Journal of Solid State Science and Technology. 3 (2014) 9 - p. Q3058-Q3070 , 2014
Link:
https://doi.org/10.1149/..
?
12
Anomalous degradation behaviors under illuminated gate bias..:
Tsai, Ming-Yen
;
Chang, Ting-Chang
;
Chu, Ann-Kuo
...
Thin Solid Films. 572 (2014) - p. 79-84 , 2014
Link:
https://doi.org/10.1016/..
?
13
Abnormal temperature-dependent floating-body effect on Hot-..:
Liu, Kuan-Ju
;
Chang, Ting-Chang
;
Yang, Ren-Ya
...
Thin Solid Films. 572 (2014) - p. 39-43 , 2014
Link:
https://doi.org/10.1016/..
?
14
Investigation of channel width-dependent threshold voltage ..:
Liu, Kuan-Hsien
;
Chang, Ting-Chang
;
Wu, Ming-Siou
...
Applied Physics Letters. 104 (2014) 13 - p. , 2014
Link:
https://doi.org/10.1063/..
?
15
Investigation of temperature-dependent asymmetric degradati..:
Chen, Bo-Wei
;
Chang, Ting-Chang
;
Hung, Yu-Ju
...
Thin Solid Films. 572 (2014) - p. 33-38 , 2014
Link:
https://doi.org/10.1016/..
1-15