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Kim, Min-Koo Han
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1

Hydrogen Passivation on the Grain Boundary and Intragranula..:

Choi, Kwon-Young ; Yoo, Juhn-Suk ; Kim, Min-Koo Han
Japanese Journal of Applied Physics.  35 (1996)  2S - p. 915 , 1996
Link: https://doi.org/10.1143/..
 
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2

Structural Dimension Effects of Plasma Hydrogenation on Low..:

Kim, Yong-Sang ; Choi, Kwon-Young ; Lee, Seong-Kyu..
Japanese Journal of Applied Physics.  33 (1994)  1S - p. 649 , 1994
Link: https://doi.org/10.1143/..
 
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3

Dual-Gate Shorted Anode SOI Lateral Insulated Gate Bipolar ..:

Lee, Byeong-Hoon ; Byeon, Dae-Seok ; Kim, Doo-Young..
Japanese Journal of Applied Physics.  36 (1997)  3S - p. 1663 , 1997
Link: https://doi.org/10.1143/..
 
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4

Latch-up Suppressed Insulated Gate Bipolar Transistor by th..:

Lee, Byeong-Hoon ; Yun, Chong-Man ; Kim, Han-Soo.
Japanese Journal of Applied Physics.  33 (1994)  1S - p. 563 , 1994
Link: https://doi.org/10.1143/..
 
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5

A Comparison Study of Edge Line Estimation Algorithms for D..:

Yi, Chang-Yong ; Li, Fangxin ; Thedja, Julian Pratama Putra...
Advances in Civil Engineering.  2024 (2024)  - p. 1-15 , 2024
Link: https://doi.org/10.1155/..
 
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6

Range Image-Aided Edge Line Estimation for Dimensional Insp..:

Li, Fangxin ; Thedja, Julian Pratama Putra ; Sim, Sung-Han..
Sustainability.  15 (2023)  16 - p. 12243 , 2023
Link: https://doi.org/10.3390/..
 
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7

High-voltage AlGaN/GaN Schottky barrier diodes on silicon u..:

Seok, Ogyun ; Han, Min-Koo ; Byun, Young-Chul...
Solid-State Electronics.  103 (2015)  - p. 49-53 , 2015
Link: https://doi.org/10.1016/..
 
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8

Effects of Composition Ratio on Solution-Processed InGaZnO ..:

Lee, Jeong-Soo ; Song, Seung-Min ; Lee, Soo-Yeon...
ECS Transactions.  53 (2013)  2 - p. 197-202 , 2013
Link: https://doi.org/10.1149/..
 
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9

Various Schottky Contacts of AlGaN/GaN Schottky Barrier Dio..:

Ahn, Woojin ; Seok, Ogyun ; Ha, Min-Woo..
ECS Transactions.  53 (2013)  2 - p. 171-176 , 2013
Link: https://doi.org/10.1149/..
 
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10

Effects of O2 plasma treatment on low temperature solution-..:

Lee, Jeong-Soo ; Song, Seung-Min ; Kim, Yong-Hoon..
physica status solidi (a).  210 (2013)  9 - p. 1745-1749 , 2013
Link: https://doi.org/10.1002/..
 
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11

Effects of Ultra-Violet Treatment on Electrical Characteris..:

Lee, Jeong-Soo ; Song, Seung-Min ; Kang, Dong-Won...
ECS Transactions.  50 (2013)  8 - p. 121-127 , 2013
Link: https://doi.org/10.1149/..
 
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12

Effects of Annealing Temperature on Electrical Characterist..:

Lee, Jeong-Soo ; Kim, Yong-Jin ; Lee, Yong-Uk...
Japanese Journal of Applied Physics.  51 (2012)  6R - p. 061101 , 2012
Link: https://doi.org/10.7567/..
 
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13

Effect of Channel Length on the Reliability of Amorphous In..:

Lee, Soo-Yeon ; Kim, Sun-Jae ; Lee, Young Wook...
Japanese Journal of Applied Physics.  51 (2012)  3S - p. 03CB03 , 2012
Link: https://doi.org/10.1143/..
 
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14

Effect of Dynamic Bias Stress in Short-Channel (L=1.5 µm) p..:

Choi, Sung-Hwan ; Mo, Yeon-Gon ; Kim, Hye-Dong.
Japanese Journal of Applied Physics.  51 (2012)  2R - p. 021401 , 2012
Link: https://doi.org/10.7567/..
 
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15

Effect of Channel Length on the Reliability of Amorphous In..:

Lee, Soo-Yeon ; Kim, Sun-Jae ; Lee, Young Wook...
Japanese Journal of Applied Physics.  51 (2012)  3S - p. 03CB03 , 2012
Link: https://doi.org/10.7567/..
 
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