Lashkare, Sandip
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1

Process-Voltage-Temperature Variability Estimation of Tunne..:

Patil, Shubham ; Sharma, Anand ; Gaurav, R....
IEEE Transactions on Electron Devices.  71 (2024)  1 - p. 752-758 , 2024
 
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2

FeFET-Based MirrorBit Cell for High-Density NVM Storage:

Meihar, Paritosh ; Srinu, Rowtu ; Saraswat, Vivek...
IEEE Transactions on Electron Devices.  71 (2024)  4 - p. 2380-2385 , 2024
 
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4

Ferroelectric MirrorBit-Integrated Field-Programmable Memor..:

Meihar, Paritosh ; Srinu, Rowtu ; Lashkare, Sandip...
IEEE Transactions on Electron Devices.  71 (2024)  5 - p. 2957-2962 , 2024
 
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5

Interlayer-Engineered Local Epitaxial Templating Induced En..:

Rowtu, Srinu ; Meihar, Paritosh ; Pandey, Adityanarayan...
IEEE Transactions on Electron Devices.  70 (2023)  7 - p. 3536-3541 , 2023
 
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7

Evolution of Ferroelectricity With Annealing Temperature an..:

Ali, Hanif ; Pandey, Adityanarayan ; Srinu, Rowtu...
IEEE Transactions on Electron Devices.  70 (2023)  11 - p. 6034-6041 , 2023
 
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8

Emerging Memory Technologies for Data Storage and Brain-Ins..:

Lashkare, Sandip ; Uddin, Wasi ; Priyadarshi, Kumar.
Proceedings of the National Academy of Sciences, India Section A: Physical Sciences.  93 (2023)  3 - p. 459-476 , 2023
 
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9

Investigating Transient Characteristics of Volatile Hystere..:

Sakhuja, Jayatika ; Lashkare, Sandip ; Jana, Koustav.
IEEE Transactions on Electron Devices.  67 (2020)  12 - p. 5520-5525 , 2020
 
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