I agree that this site is using cookies. You can find further informations here.
X
Linten, Dimitri
18  results:
Articles (Online) X
Search for persons X
?
1

Negative Bias-Temperature Instabilities and Low-Frequency N..:

Luo, Xuyi ; Zhang, En Xia ; Wang, Peng Fei...
IEEE Transactions on Device and Materials Reliability.  23 (2023)  1 - p. 153-161 , 2023
Link: https://doi.org/10.1109/..
 
?
2

Fault Attack Investigation on TaOx Resistive-RAM for Cyber ..:

Kumar, Ankit ; Degraeve, Robin ; Beckers, Arthur...
IEEE Transactions on Electron Devices.  70 (2023)  8 - p. 4170-4177 , 2023
Link: https://doi.org/10.1109/..
 
?
3

Effects of Geometry and Cycling on the Radiation Response o..:

Cao, Jingchen ; Wynocker, Isabella ; Zhang, En Xia...
IEEE Transactions on Nuclear Science.  70 (2023)  4 - p. 634-640 , 2023
Link: https://doi.org/10.1109/..
 
?
4

A Pragmatic Model to Predict Future Device Aging:

Brown, James ; Tok, Kean Hong ; Gao, Rui...
IEEE Access.  11 (2023)  - p. 127725-127736 , 2023
Link: https://doi.org/10.1109/..
 
?
5

Deep Understanding of Electron Beam Effects on 2D Layered S..:

Lee, Kookjin ; Ji, Hyunjin ; Kim, Yanghee...
Advanced Materials Interfaces.  9 (2022)  9 - p. , 2022
Link: https://doi.org/10.1002/..
 
?
6

ESD nMOSFETs in Advanced Bulk FinFET Technology With Dual S..:

Chen, Wen-Chieh ; Chen, Shih-Hung ; Chiarella, Thomas...
IEEE Transactions on Electron Devices.  69 (2022)  9 - p. 5357-5362 , 2022
Link: https://doi.org/10.1109/..
 
?
7

Negative-Bias-Stress and Total-Ionizing-Dose Effects in Dee..:

Rony, M. W. ; Zhang, En Xia ; Toguchi, Shintaro...
IEEE Transactions on Nuclear Science.  69 (2022)  3 - p. 299-306 , 2022
Link: https://doi.org/10.1109/..
 
?
8

TID Effects in Highly Scaled Gate-All-Around Si Nanowire CM..:

Bonaldo, Stefano ; Gorchichko, Mariia ; Zhang, En Xia...
IEEE Transactions on Nuclear Science.  69 (2022)  7 - p. 1444-1452 , 2022
Link: https://doi.org/10.1109/..
 
?
9

Cyclic Thermal Effects on Devices of Two‐Dimensional Layere..:

Kim, Yeonsu ; Kaczer, Ben ; Verreck, Devin...
Advanced Electronic Materials.  7 (2021)  9 - p. 2100348 , 2021
Link: https://doi.org/10.1002/..
 
?
10

Extensive assessment of the charge-trapping kinetics in InG..:

Putcha, Vamsi ; Franco, Jacopo ; Vais, Abhitosh...
Microelectronics Reliability.  115 (2020)  - p. 113996 , 2020
Link: https://doi.org/10.1016/..
 
?
11

Electrostatic discharge robustness of amorphous indium-gall..:

Simicic, Marko ; Ashif, Nowab Reza ; Hellings, Geert...
Microelectronics Reliability.  108 (2020)  - p. 113632 , 2020
Link: https://doi.org/10.1016/..
 
?
12

Discussion on the Figures of Merit of Identified Traps Loca..:

Cretu, Bogdan ; Nafaa, Beya ; Simoen, Eddy...
ECS Transactions.  97 (2020)  5 - p. 45-51 , 2020
Link: https://doi.org/10.1149/..
 
?
13

Correlated Time-0 and Hot-Carrier Stress Induced FinFET Par..:

Makarov, Alexander ; Roussel, Philippe ; Bury, Erik...
Micromachines.  11 (2020)  7 - p. 657 , 2020
Link: https://doi.org/10.3390/..
 
?
14

A Cautionary Note When Looking for a Truly Reconfigurable R..:

Chuang, Kai-Hsin ; Degraeve, Robin ; Fantini, Andrea...
IACR Transactions on Cryptographic Hardware and Embedded Systems.  , 2018
Link: https://doi.org/10.46586..
 
?
15

Impact of on- and off-chip protection on the transient-indu..:

Scholz, Mirko ; Chen, Shih-Hung ; Hellings, Geert.
Microelectronics Reliability.  57 (2016)  - p. 53-58 , 2016
Link: https://doi.org/10.1016/..
 
1-15