Losee, Peter A.
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9

Bipolar Degradation in 4H-SiC Thyristors:

Soloviev, Stanislav I. ; Losee, Peter A. ; Arthur, Stephen...
Materials Science Forum.  717-720 (2012)  - p. 1175-1178 , 2012
 
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11

300°C Silicon Carbide Integrated Circuits:

Stum, Zachary ; Tilak, Vinayak ; Losee, Peter A...
Materials Science Forum.  679-680 (2011)  - p. 730-733 , 2011
 
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12

4kV Silicon Carbide MOSFETs:

Stum, Zachary ; Bolotnikov, A.V. ; Losee, Peter A....
Materials Science Forum.  679-680 (2011)  - p. 637-640 , 2011
 
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13

Performance and Reliability of SiC MOSFETs for High-Current..:

Matocha, Kevin ; Losee, Peter A. ; Gowda, Arun...
Materials Science Forum.  645-648 (2010)  - p. 1123-1126 , 2010
 
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14

3kV 4H-SiC Thyristors for Pulsed Power Applications:

Elasser, Ahmed ; Losee, Peter A. ; Arthur, Steve...
Materials Science Forum.  645-648 (2010)  - p. 1053-1056 , 2010
 
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