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McKenna, K.P.
3263
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1
Measurements of Properties of Antihydrogen:
Olin, Art
;
M. Ahmadi, B.X.R. Alves, C.J. Baker, W. Bertsche, E. Butler, A. Capra, C. Carruth, A.E. Charman, L.T. Evans, C.L. Cesar, M. Charlton, S. Cohen, R. Collister, S. Eriksson, A. Evans, L.T. Evans, N. Evetts, J. Fajans, T. Friesen, M.C. Fujiwara, D.R. Gill, J.S. Hangst, W.N. Hardy, M.E. Hayden, C.A. Isaac, M.A. Johnson, J.M Jones, S.A. Jones, S. Jonsell, A. Khramov, P. Knapp, L. Kurchaninov, N. Madsen, D. Maxwell, J.T.K. McKenna, S.Menary, T. Momose, J.J. Munich, K. Olchanski, A. Olin, P. Pusa, C. Rasmussen, F.
International Journal of Modern Physics: Conference Series. 46 (2018) - p. 1860069 , 2018
Link:
https://doi.org/10.1142/..
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2
Grain-Boundary Structural Relaxation in Sb2Se3 Thin-Film Ph..:
Lomas-Zapata, R.A.
;
McKenna, K.P.
;
Ramasse, Q.M.
...
PRX Energy. 3 (2024) 1 - p. , 2024
Link:
https://doi.org/10.1103/..
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3
Structure and electronic properties of domain walls and sta..:
Rigby, O. M.
;
Richards-Hlabangana, T.
;
Ramasse, Q. M.
...
Journal of Applied Physics. 132 (2022) 18 - p. , 2022
Link:
https://doi.org/10.1063/..
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4
Nano-faceted stabilization of polar-oxide thin films: The c..:
Kerrigan, A.
;
Pande, K.
;
Pingstone, D.
...
Applied Surface Science. 596 (2022) - p. 153490 , 2022
Link:
https://doi.org/10.1016/..
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5
First principles investigation of Y2O3-doped HfO2:
Padilha, A. C. M.
;
McKenna, K. P.
Journal of Applied Physics. 126 (2019) 8 - p. , 2019
Link:
https://doi.org/10.1063/..
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6
Crystal structure and anti-site boundary defect characteris..:
Mendis, B. G.
;
McKenna, K. P.
;
Gurieva, G.
..
Journal of Materials Chemistry A. 6 (2018) 1 - p. 189-197 , 2018
Link:
https://doi.org/10.1039/..
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7
First-Principles Modeling of Polaron Formation in TiO2 Poly..:
Elmaslmane, A. R.
;
Watkins, M. B.
;
McKenna, K. P.
Journal of Chemical Theory and Computation. 14 (2018) 7 - p. 3740-3751 , 2018
Link:
https://doi.org/10.1021/..
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8
Structure and properties of a model conductive filament/hos..:
Padilha, A. C. M.
;
McKenna, K. P.
Physical Review Materials. 2 (2018) 4 - p. , 2018
Link:
https://doi.org/10.1103/..
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9
Accuracy of electron densities obtained via Koopmans-compli..:
Elmaslmane, A. R.
;
Wetherell, J.
;
Hodgson, M. J. P.
..
Physical Review Materials. 2 (2018) 4 - p. , 2018
Link:
https://doi.org/10.1103/..
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10
First principles modeling of electron tunneling between def..:
McKenna, K.P.
;
Blumberger, J.
Microelectronic Engineering. 147 (2015) - p. 235-238 , 2015
Link:
https://doi.org/10.1016/..
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11
Optimal stoichiometry for nucleation and growth of conducti..:
McKenna, K P
Modelling and Simulation in Materials Science and Engineering. 22 (2014) 2 - p. 025001 , 2014
Link:
https://doi.org/10.1088/..
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12
Laser-assisted field evaporation from insulators triggered ..:
Tamura, H.
;
Tsukada, M.
;
McKenna, K. P.
...
Physical Review B. 86 (2012) 19 - p. , 2012
Link:
https://doi.org/10.1103/..
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13
Mechanism of laser assisted field evaporation from insulati..:
Tsukada, M.
;
Tamura, H.
;
McKenna, K.P.
...
Ultramicroscopy. 111 (2011) 6 - p. 567-570 , 2011
Link:
https://doi.org/10.1016/..
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14
Electronic properties of defects in polycrystalline dielect..:
McKenna, K.P.
;
Shluger, A.L.
Microelectronic Engineering. 86 (2009) 7-9 - p. 1751-1755 , 2009
Link:
https://doi.org/10.1016/..
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15
First-principles calculations of defects near a grain bound..:
McKenna, K. P.
;
Shluger, A. L.
Physical Review B. 79 (2009) 22 - p. , 2009
Link:
https://doi.org/10.1103/..
1-15