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Ning, Bingxu
38
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1
Design and verification of multiple SEU mitigated circuits ..:
Yu, Jian
;
Cai, Chang
;
Ning, Bingxu
...
Microelectronics Reliability. 126 (2021) - p. 114340 , 2021
Link:
https://doi.org/10.1016/..
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2
Measurement and evaluation of the Single Event Effects of h..:
Wang, Shu
;
Cai, Chang
;
Ning, Bingxu
...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 1012 (2021) - p. 165618 , 2021
Link:
https://doi.org/10.1016/..
?
3
SEU sensitivity and large spacing TMR efficiency of Kintex-..:
Cai, Chang
;
Ning, Bingxu
;
Fan, Xue
...
Science China Information Sciences. 65 (2021) 2 - p. , 2021
Link:
https://doi.org/10.1007/..
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4
Total ionizing dose induced single transistor latchup in 13..:
Fan, Shuang
;
Hu, Zhi-Yuan
;
Zhang, Zheng-Xuan
...
Chinese Physics B. 26 (2017) 3 - p. 036103 , 2017
Link:
https://doi.org/10.1088/..
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5
Total-Ionizing-Dose-Induced Body Current Lowering in the 13..:
Liu, Xiao-Nian
;
Dai, Li-Hua
;
Ning, Bing-Xu
.
Chinese Physics Letters. 34 (2017) 1 - p. 016103 , 2017
Link:
https://doi.org/10.1088/..
?
6
Bias dependence of TID induced single transistor latch for ..:
Fan, Shuang
;
Ning, Bingxu
;
Hu, Zhiyuan
...
Microelectronics Reliability. 56 (2016) - p. 1-9 , 2016
Link:
https://doi.org/10.1016/..
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7
Radiation-enhanced gate-induced-drain-leakage current in th..:
Peng, Chao
;
Hu, Zhiyuan
;
Ning, Bingxu
...
Solid-State Electronics. 106 (2015) - p. 81-86 , 2015
Link:
https://doi.org/10.1016/..
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8
Investigating the degradation mechanisms caused by the TID ..:
Peng, Chao
;
Hu, Zhiyuan
;
Zhang, Zhengxuan
...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 748 (2014) - p. 70-78 , 2014
Link:
https://doi.org/10.1016/..
?
9
Total ionizing dose effect in 0.2μm PDSOI NMOSFETs with sha..:
Peng, Chao
;
Hu, Zhiyuan
;
Zhang, Zhengxuan
...
Microelectronics Reliability. 54 (2014) 4 - p. 730-737 , 2014
Link:
https://doi.org/10.1016/..
?
10
Utilizing a shallow trench isolation parasitic transistor t..:
Peng, Chao
;
Hu, Zhi-Yuan
;
Ning, Bing-Xu
...
Chinese Physics B. 23 (2014) 9 - p. 090702 , 2014
Link:
https://doi.org/10.1088/..
?
11
Comprehensive study on the TID effects of 0.13μm partially ..:
Ning, Bingxu
;
Bi, Dawei
;
Huang, Huixiang
...
Microelectronics Journal. 44 (2013) 2 - p. 86-93 , 2013
Link:
https://doi.org/10.1016/..
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12
Enhanced Radiation Sensitivity in Short-Channel Partially D..:
Peng, Chao
;
Zhang, Zheng-Xuan
;
Hu, Zhi-Yuan
...
Chinese Physics Letters. 30 (2013) 9 - p. 098502 , 2013
Link:
https://doi.org/10.1088/..
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13
Bias dependence of TID radiation responses of 0.13μm partia..:
Ning, Bingxu
;
Bi, Dawei
;
Huang, Huixiang
...
Microelectronics Reliability. 53 (2013) 2 - p. 259-264 , 2013
Link:
https://doi.org/10.1016/..
?
14
Radiation-induced shallow trench isolation leakage in 180-n..:
Ning, Bingxu
;
Zhang, Zhengxuan
;
Liu, Zhangli
...
Microelectronics Reliability. 52 (2012) 1 - p. 130-136 , 2012
Link:
https://doi.org/10.1016/..
?
15
Analysis of bias effects on the total ionizing dose respons..:
Liu, Zhangli
;
Hu, Zhiyuan
;
Zhang, Zhengxuan
...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 644 (2011) 1 - p. 48-54 , 2011
Link:
https://doi.org/10.1016/..
1-15