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Plombon, John J.
10
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1
Voltage-based magnetization switching and reading in magnet..:
Vaz, Diogo C.
;
Lin, Chia-Ching
;
Plombon, John J.
...
Nature Communications. 15 (2024) 1 - p. , 2024
Link:
https://doi.org/10.1038/..
?
2
All-Electrical Spin-to-Charge Conversion in Sputtered BixSe..:
Choi, Won Young
;
Arango, Isabel C.
;
Pham, Van Tuong
...
Nano Letters. 22 (2022) 19 - p. 7992-7999 , 2022
Link:
https://doi.org/10.1021/..
?
3
Effect of cobalt substitution on the structural, ferroelect..:
Joshi, Chhatra R.
;
Acharya, Mahendra
;
Sheikh, Md Sariful
..
Journal of Applied Physics. 132 (2022) 19 - p. , 2022
Link:
https://doi.org/10.1063/..
?
4
Nanocrystalline copper films are never flat:
Zhang, Xiaopu
;
Han, Jian
;
Plombon, John J.
...
Science. 357 (2017) 6349 - p. 397-400 , 2017
Link:
https://doi.org/10.1126/..
?
5
Nanocrystalline copper films are never flat:
Zhang, Xiaopu
;
Han, Jian
;
Plombon, John J.
...
Science. 357 (2017) 6349 - p. 397-400 , 2017
Link:
https://www.jstor.org/st..
?
6
Atomic Layer Etching: An Industry Perspective:
T. Carver, Colin
;
J. Plombon, John
;
E. Romero, Patricio
...
ECS Journal of Solid State Science and Technology. 4 (2015) 6 - p. N5005-N5009 , 2015
Link:
https://doi.org/10.1149/..
?
7
Electron transport properties of sub-3-nm diameter copper n..:
Jones, Sarah L. T.
;
Sanchez-Soares, Alfonso
;
Plombon, John J.
...
Physical Review B. 92 (2015) 11 - p. , 2015
Link:
https://doi.org/10.1103/..
?
8
Connecting Single Molecule Electrical Measurements to Ensem..:
Kim, Woo-Jae
;
Lee, Chang Young
;
O'brien, Kevin P.
...
Journal of the American Chemical Society. 131 (2009) 9 - p. 3128-3129 , 2009
Link:
https://doi.org/10.1021/..
?
9
Relationship between root‐mean‐square and peak‐to‐peak jitt..:
Babić, Dubravko
;
Plombon, John
Microwave and Optical Technology Letters. 39 (2003) 4 - p. 323-326 , 2003
Link:
https://doi.org/10.1002/..
?
10
Far-infrared perturbation of electron tunneling in reaction..:
Austin, Robert H.
;
Hong, Mi K.
;
Moser, Chris
.
Chemical Physics. 158 (1991) 2-3 - p. 473-486 , 1991
Link:
https://doi.org/10.1016/..
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