E-LIB Suche - Ergebnisse für: Rampazzo, Fabiana

1

Microwave and Millimeter-Wave GaN HEMTs: Impact of Epitaxia..:

Zanoni, Enrico ; De Santi, Carlo ; Gao, Zhan...
IEEE Transactions on Electron Devices. 71 (2024) 3 - p. 1396-1407 , 2024

Link: https://doi.org/10.1109/..

2

Impact of the oxide aperture width on the degradation of 84..:

Zenari, Michele ; Buffolo, Matteo ; Rampazzo, Fabiana...
IEEE Journal of Selected Topics in Quantum Electronics. , 2024

Link: https://doi.org/10.1109/..

3

V-Pits and Trench-Like Defects in High Periodicity MQWs GaN..:

Nicoletto, Marco ; Caria, Alessandro ; Rampazzo, Fabiana...
IEEE Transactions on Electron Devices. 71 (2024) 3 - p. 2051-2057 , 2024

Link: https://doi.org/10.1109/..

4

Transconductance Overshoot, a New Trap-Related Effect in Al..:

Zhan, Gao ; Rampazzo, Fabiana ; De Santi, Carlo...
IEEE Transactions on Electron Devices. 70 (2023) 6 - p. 3005-3010 , 2023

Link: https://doi.org/10.1109/..

5

Influence of V-Pits on the Turn-On Voltage of GaN-Based Hig..:

Nicoletto, Marco ; Caria, Alessandro ; Rampazzo, Fabiana...
IEEE Journal of Photovoltaics. 13 (2023) 6 - p. 891-898 , 2023

Link: https://doi.org/10.1109/..

6

Dynamic Behavior of Threshold Voltage and ID–VDS Kink in Al..:

Gao, Zhan ; De Santi, Carlo ; Rampazzo, Fabiana...
IEEE Transactions on Electron Devices. 70 (2023) 12 - p. 6256-6261 , 2023

Link: https://doi.org/10.1109/..

7

Failure Physics and Reliability of GaN‐Based HEMTs for Micr..:

Zanoni, Enrico ; Rampazzo, Fabiana ; De Santi, Carlo...
physica status solidi (a). 219 (2022) 24 - p. , 2022

Link: https://doi.org/10.1002/..

8

Impact of an AlGaN spike in the buffer in 0.15 μm AlGaN/GaN..:

Gao, Zhan ; Rampazzo, Fabiana ; Meneghini, Matteo...
Microelectronics Reliability. 126 (2021) - p. 114318 , 2021

Link: https://doi.org/10.1016/..

9

Short term reliability and robustness of ultra-thin barrier..:

Gao, ZHan ; Meneghini, Matteo ; Harrouche, Kathia...
Microelectronics Reliability. 123 (2021) - p. 114199 , 2021

Link: https://doi.org/10.1016/..

10

Electrical and Electroluminescence Characteristics of AlGaN..:

Meneghini, Matteo ; Zanandrea, Alberto ; Rampazzo, Fabiana...
Japanese Journal of Applied Physics. 52 (2013) 8S - p. 08JN17 , 2013

Link: https://doi.org/10.7567/..

11

(Invited) Electric-Field and Thermally-Activated Failure Me..:

Zanoni, Enrico ; Meneghesso, Gaudenzio ; Meneghini, Matteo...
ECS Transactions. 41 (2011) 8 - p. 237-249 , 2011

Link: https://doi.org/10.1149/..

12

Improved stability in wide-recess InP HEMTs by means of a f..:

Suemitsu, Tetsuya ; Fukai, Yoshino K. ; Tokumitsu, Masami...
IEICE Electronics Express. 3 (2006) 13 - p. 310-315 , 2006

Link: https://doi.org/10.1587/..

13

Modelling and simulation of wool steaming for the efficient..:

Ferro, Fabiana Federica ; Rampazzo, Mirco ; Beghi, Alessandro...
E3S Web of Conferences. 128 (2019) - p. 09010 , 2019

Link: https://doi.org/10.1051/..

14

Intellectual function evaluation of first generation immigr..:

Montanaro, Maria ; Colombatti, Raffaella ; Pugliese, Marisa...
Italian Journal of Pediatrics. 39 (2013) 1 - p. , 2013

Link: https://doi.org/10.1186/..

15

Fissuras labiopalatinas: Revisão de Literatura:

Moreira Gonzalez Silva, João Pedro ; Tamillles Campos Martins, Kassia ; Souza da Silva, Gabrielle...
Brazilian Journal of Implantology and Health Sciences. 6 (2024) 3 - p. 2875-2883 , 2024

Link: https://doi.org/10.36557..