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Rassoul, Nouredine
9
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1
Study of Contact Resistance Components in Short-Channel Ind..:
Tang, Hongwei
;
Dekkers, Harold
;
Rassoul, Nouredine
...
IEEE Transactions on Electron Devices. 71 (2024) 1 - p. 567-573 , 2024
Link:
https://doi.org/10.1109/..
?
2
Device modeling of two-steps oxygen anneal-based submicron ..:
Kim, Donguk
;
Kim, Je-Hyuk
;
Choi, Woo Sik
...
Scientific Reports. 12 (2022) 1 - p. , 2022
Link:
https://doi.org/10.1038/..
?
3
Deposition, Characterization, and Performance of Spinel InG..:
Dekkers, Hendrik F. W.
;
van Setten, Michiel J.
;
Belmonte, Attilio
...
ACS Applied Electronic Materials. 4 (2022) 3 - p. 1238-1249 , 2022
Link:
https://doi.org/10.1021/..
?
4
11‐2: Technology Developments in High‐Resolution FMM‐free O..:
Ke, Tung-Huei
;
Glushkova, Anastasia
;
Sandeheng, Calvin Mona
...
SID Symposium Digest of Technical Papers. 52 (2021) 1 - p. 127-130 , 2021
Link:
https://doi.org/10.1002/..
?
5
Oxygen Defect Stability in Amorphous, C-Axis Aligned, and S..:
van Setten, Michiel J.
;
Dekkers, Harold F. W.
;
Kljucar, Luka
...
ACS Applied Electronic Materials. 3 (2021) 9 - p. 4037-4046 , 2021
Link:
https://doi.org/10.1021/..
?
6
(Invited) Sub-40mV Sigma VTH Igzo nFETs in 300mm Fab:
Mitard, Jerome
;
Kljucar, Luka
;
Rassoul, Nouredine
...
ECS Transactions. 98 (2020) 7 - p. 205-217 , 2020
Link:
https://doi.org/10.1149/..
?
7
Fabrication of magnetic tunnel junctions connected through ..:
Wan, Danny
;
Manfrini, Mauricio
;
Vaysset, Adrien
...
Japanese Journal of Applied Physics. 57 (2018) 4S - p. 04FN01 , 2018
Link:
https://doi.org/10.7567/..
?
8
RIE dynamics for extreme wafer thinning applications:
Rassoul, Nouredine
;
Jourdain, Anne
;
Tutunjyan, Nina
...
Microelectronic Engineering. 192 (2018) - p. 30-37 , 2018
Link:
https://doi.org/10.1016/..
?
9
Etch process modules development and integration in 3D-SOC ..:
Tutunjyan, Nina
;
Sardo, Stefano
;
De Vos, Joeri
...
Microelectronic Engineering. 196 (2018) - p. 38-48 , 2018
Link:
https://doi.org/10.1016/..
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