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Reboh, S
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1

Methodology for parameters extraction with undoped junction..:

Zerhouni Abdou, N. ; Reboh, S. ; Brunet, L....
Solid-State Electronics.  217 (2024)  - p. 108897 , 2024
Link: https://doi.org/10.1016/..
 
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2

Low Temperature Junction Formation for EZ-FET:

Zerhouni Abdou, N. ; Acosta Alba, P. ; Brunet, L....
IEEE Journal of the Electron Devices Society.  12 (2024)  - p. 384-389 , 2024
Link: https://doi.org/10.1109/..
 
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3

Undoped junctionless EZ-FET: Model and measurements:

Zerhouni Abdou, N. ; Reboh, S. ; Alepidis, M....
Solid-State Electronics.  208 (2023)  - p. 108731 , 2023
Link: https://doi.org/10.1016/..
 
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4

A simple test structure for the electrical characterization..:

Alepidis, M. ; Ionica, I. ; Milesi, F....
Solid-State Electronics.  185 (2021)  - p. 108047 , 2021
Link: https://doi.org/10.1016/..
 
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5

Elucidating the capability of electron backscattering for 3..:

Trombini, H ; Vos, M ; Reboh, S.
Journal of Physics D: Applied Physics.  53 (2020)  42 - p. 425103 , 2020
Link: https://doi.org/10.1088/..
 
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6

Strain, stress, and mechanical relaxation in fin-patterned ..:

Reboh, S. ; Coquand, R. ; Barraud, S....
Applied Physics Letters.  112 (2018)  5 - p. , 2018
Link: https://doi.org/10.1063/..
 
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7

Nanobeam Diffraction and Geometric Phase Analysis for Strai..:

Li, J. ; Reboh, S. ; Chao, Robin...
Microscopy and Microanalysis.  22 (2016)  S3 - p. 1528-1529 , 2016
Link: https://doi.org/10.1017/..
 
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8

Converting SOI to sSOI through Amorphization and Crystalliz..:

Maitrejean, S. ; Loubet, N. ; Augendre, E....
ECS Journal of Solid State Science and Technology.  4 (2015)  9 - p. P376-P381 , 2015
Link: https://doi.org/10.1149/..
 
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9

Modelling of point defect complex formation and its applica..:

Cherkashin, N. ; Darras, F.-X. ; Pochet, P....
Acta Materialia.  99 (2015)  - p. 187-195 , 2015
Link: https://doi.org/10.1016/..
 
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10

Dynamical effects in strain measurements by dark-field elec..:

Javon, E. ; Lubk, A. ; Cours, R....
Ultramicroscopy.  147 (2014)  - p. 70-85 , 2014
Link: https://doi.org/10.1016/..
 
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11

A method to determine the Young's modulus of thin-film elem..:

Reboh, S. ; Benzo, P. ; Morin, P....
Applied Physics Letters.  102 (2013)  5 - p. , 2013
Link: https://doi.org/10.1063/..
 
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12

Effect of H-implantation in the local elastic properties of..:

Reboh, S. ; Rieutord, F. ; Vignoud, L....
Applied Physics Letters.  103 (2013)  18 - p. 181911 , 2013
Link: https://doi.org/10.1063/..
 
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13

Effect of the substrate orientation on the formation of He-..:

Vallet, M. ; Barbot, J. F. ; Declémy, A...
Journal of Applied Physics.  114 (2013)  19 - p. , 2013
Link: https://doi.org/10.1063/..
 
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14

Determination of stress, strain, and elemental distribution..:

Cherkashin, N. ; Reboh, S. ; Hÿtch, M. J....
Applied Physics Letters.  102 (2013)  17 - p. , 2013
Link: https://doi.org/10.1063/..
 
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15

Nanoscale organization by elastic interactions between H an..:

Reboh, S. ; Barbot, J. F. ; Vallet, M....
Journal of Applied Physics.  114 (2013)  7 - p. , 2013
Link: https://doi.org/10.1063/..
 
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