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Seelmann-Eggebert, M.
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1

Publisher's Note: "X-ray photoelectron spectroscopy study o..:

Zhang, Y. ; Gajjala, G. ; Hofmann, T....
Journal of Applied Physics.  109 (2011)  2 - p. , 2011
Link: https://doi.org/10.1063/..
 
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2

X-ray photoelectron spectroscopy study of the chemical inte..:

Zhang, Y. ; Gajjala, G. ; Hofmann, T....
Journal of Applied Physics.  108 (2010)  9 - p. , 2010
Link: https://doi.org/10.1063/..
 
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3

Heat-spreading diamond films for GaN-based high-power trans..:

Seelmann-Eggebert, M. ; Meisen, P. ; Schaudel, F....
Diamond and Related Materials.  10 (2001)  3-7 - p. 744-749 , 2001
Link: https://doi.org/10.1016/..
 
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4

Polarity determination for GaN films grown on (0001) sapphi..:

Rouviere, J. L. ; Weyher, J. L. ; Seelmann-Eggebert, M..
Applied Physics Letters.  73 (1998)  5 - p. 668-670 , 1998
Link: https://doi.org/10.1063/..
 
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5

Surface cleaning and etching of CdZnTe and CdTe in H2/Ar, C..:

Keller, Robert C. ; Zimmermann, H. ; Seelmann-Eggebert, M..
Journal of Electronic Materials.  26 (1997)  6 - p. 542-551 , 1997
Link: https://doi.org/10.1007/..
 
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6

Polarity of (00.1) GaN epilayers grown on a (00.1) sapphire:

Seelmann-Eggebert, M. ; Weyher, J. L. ; Obloh, H....
Applied Physics Letters.  71 (1997)  18 - p. 2635-2637 , 1997
Link: https://doi.org/10.1063/..
 
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7

Imaging scatterer planes by photoelectron diffraction:

Seelmann-Eggebert, M.
Surface Science.  377-379 (1997)  - p. 1094-1100 , 1997
Link: https://doi.org/10.1016/..
 
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8

Growth of Sn thin films on CdTe(111):

Zimmermann, H. ; Keller, Robert C. ; Meisen, P..
Surface Science.  377-379 (1997)  - p. 904-908 , 1997
Link: https://doi.org/10.1016/..
 
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9

Interface formation between deposited Sn and Hg0.8Cd0.2Te:

Zimmermann, H. ; Keller, Robert C. ; Meisen, P...
Journal of Electronic Materials.  25 (1996)  8 - p. 1293-1299 , 1996
Link: https://doi.org/10.1007/..
 
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10

Dry etching of Hg1−xCdxTe using CH4/H2/Ar/N2 electron cyclo..:

Keller, Robert C. ; Seelmann-Eggebert, M. ; Richter, H. J.
Journal of Electronic Materials.  25 (1996)  8 - p. 1270-1275 , 1996
Link: https://doi.org/10.1007/..
 
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11

Addition of N2 as a polymer deposition inhibitor in CH4/H2 ..:

Keller, Robert C. ; Seelmann-Eggebert, M. ; Richter, H. J.
Applied Physics Letters.  67 (1995)  25 - p. 3750-3752 , 1995
Link: https://doi.org/10.1063/..
 
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12

Reaction chemistry and resulting surface structure of HgCdT..:

Keller, Robert C. ; Seelmann-Eggebert, M. ; Richter, H. J.
Journal of Electronic Materials.  24 (1995)  9 - p. 1155-1160 , 1995
Link: https://doi.org/10.1007/..
 
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13

A case study for XPD in the presence of a compositional dep..:

Seelmann-Eggebert, M. ; Carey, G.P. ; Klauser, R..
Surface Science.  287-288 (1993)  - p. 495-501 , 1993
Link: https://doi.org/10.1016/..
 
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14

Theoretical aspects for depth profiling by ARXPS:

Seelmann-Eggebert, M. ; Richter, H.J.
Journal of Electron Spectroscopy and Related Phenomena.  52 (1990)  - p. 273-283 , 1990
Link: https://doi.org/10.1016/..
 
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15

Properties of sequentially sputtered tungsten silicide thin..:

Pletschen, W. ; Herres, N. ; Maier, M....
Applied Surface Science.  38 (1989)  1-4 - p. 259-268 , 1989
Link: https://doi.org/10.1016/..
 
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