Yu, Guohao
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2

Annealing Process on Metal–Oxide–Semiconductor Channel Prop..:

Zhou, Jiaan ; Yang, An ; Yu, Guohao...
physica status solidi (RRL) – Rapid Research Letters.  , 2024
 
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5

Current-collapse suppression and leakage-current decrease i..:

Liu, Bosen ; Yu, Guohao ; Jia, Huimin...
Journal of Semiconductors.  45 (2024)  7 - p. 072501 , 2024
 
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6

Monolithic Investigation of Hydrogen Plasma-Treated and Etc..:

Li, Fan ; Liang, Ye ; Zhang, Yuanlei...
IEEE Transactions on Electron Devices.  71 (2024)  6 - p. 3801-3804 , 2024
 
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9

Study of enhancement-mode GaN pFET with H plasma treated ga..:

Gao, Xiaotian ; Yu, Guohao ; Zhou, Jiaan...
Journal of Semiconductors.  44 (2023)  11 - p. 112801 , 2023
 
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10

Comparative Analysis of the GaN Nonpolar Plane Morphology b..:

Zhou, Jiaan ; Tang, Wenxin ; Ju, Tao...
ACS Applied Materials & Interfaces.  15 (2023)  21 - p. 26159-26165 , 2023
 
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12

Gate leakage mechanisms of the AlGaN/GaN HEMT with fluorina..:

Ding, Xiaoyu ; Song, Liang ; Yu, Guohao...
Materials Science in Semiconductor Processing.  162 (2023)  - p. 107502 , 2023
 
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14

The effect of Si3N4/Al2O3 stacked structure of AlGaN/GaN HE..:

Xing, Yanhui ; Han, Zishuo ; Huang, Xingjie...
Microelectronics Reliability.  151 (2023)  - p. 115263 , 2023
 
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