Zhou, Zuopu
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1

Hydrogen-Related Instability of IGZO Field-Effect Transisto..:

Liu, Gan ; Kong, Qiwen ; Zhang, Dong...
IEEE Transactions on Electron Devices.  71 (2024)  5 - p. 2995-3001 , 2024
 
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2

Investigation of Charge Trapping Aggravation Induced by Ant..:

Zhou, Zuopu ; Jiao, Leming ; Zheng, Zijie...
IEEE Transactions on Electron Devices.  71 (2024)  8 - p. 4445-4452 , 2024
 
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3

BEOL-Compatible MFMIS Ferroelectric/Anti-Ferroelectric FETs..:

Zheng, Zijie ; Jiao, Leming ; Zhang, Dong...
IEEE Transactions on Electron Devices.  71 (2024)  3 - p. 1827-1833 , 2024
 
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7

Back-End-of-Line-Compatible Fin-Gate ZnO Ferroelectric Fiel..:

Kong, Qiwen ; Liu, Long ; Zheng, Zijie...
IEEE Transactions on Electron Devices.  70 (2023)  4 - p. 2059-2066 , 2023
 
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8

Grain Size Reduction of Ferroelectric HZO Enabled by Solid ..:

Zhang, Dong ; Wu, Jixuan ; Kong, Qiwen...
IEEE Transactions on Electron Devices.  70 (2023)  12 - p. 6665-6672 , 2023
 
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9

Inversion-Type Ferroelectric Capacitive Memory and Its 1-Kb..:

Zhou, Zuopu ; Jiao, Leming ; Zhou, Jiuren...
IEEE Transactions on Electron Devices.  70 (2023)  4 - p. 1641-1647 , 2023
 
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10

Time-Dependent Landau-Ginzburg Equation-Based Ferroelectric..:

Zhou, Zuopu ; Jiao, Leming ; Zhou, Jiuren...
IEEE Electron Device Letters.  43 (2022)  1 - p. 158-161 , 2022
 
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13

A 6.5 nm thick anti-ferroelectric HfAlOxfilm for energy sto..:

Zhou, Jiuren ; Kang, Yuye ; Wang, Xinke...
Journal of Physics D: Applied Physics.  55 (2021)  1 - p. 014003 , 2021
 
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