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Jahdi, Saeed
21
results:
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1
$\beta$-Ga2O3 in Power Electronics Converters: Opportunitie..:
Jahdi, Saeed
;
Kumar, Akhil S.
;
Deakin, Matthew
..
IEEE Open Journal of Power Electronics. 5 (2024) - p. 554-564 , 2024
Link:
https://doi.org/10.1109/..
?
2
Electrothermal power cycling of 15 kV SiC PiN diodes:
Shen, Chengjun
;
Jahdi, Saeed
;
Munagala, Sai Priya
...
Microelectronics Reliability. 153 (2024) - p. 115310 , 2024
Link:
https://doi.org/10.1016/..
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3
High-Energy Dynamic Avalanche to Failure by Incremental Sou..:
Hosseinzadehlish, Mana
;
Jahdi, Saeed
;
Yuan, Xibo
..
IEEE Open Journal of Industry Applications. 5 (2024) - p. 235-252 , 2024
Link:
https://doi.org/10.1109/..
?
4
A Review of Power Electronic Devices for Heavy Goods Vehicl..:
Alatise, Olayiwola
;
Deb, Arkadeep
;
Bashar, Erfan
...
Energies. 16 (2023) 11 - p. 4380 , 2023
Link:
https://doi.org/10.3390/..
?
5
Degradation Analysis of Planar, Symmetrical and Asymmetrica..:
Yu, Renze
;
Jahdi, Saeed
;
Mellor, Phil
...
IEEE Transactions on Power Electronics. 38 (2023) 9 - p. 10933-10946 , 2023
Link:
https://doi.org/10.1109/..
?
6
Measurements and Review of Failure Mechanisms and Reliabili..:
Yu, Renze
;
Jahdi, Saeed
;
Alatise, Olayiwola
...
IEEE Transactions on Device and Materials Reliability. 23 (2023) 4 - p. 544-563 , 2023
Link:
https://doi.org/10.1109/..
?
7
Electrothermal Power Cycling to Failure of Discrete Planar,..:
Yang, Juefei
;
Jahdi, Saeed
;
Yu, Renze
.
IEEE Open Journal of Power Electronics. 4 (2023) - p. 887-899 , 2023
Link:
https://doi.org/10.1109/..
?
8
Impact of Turn-Off Gate Voltage and Temperature on Threshol..:
Deb, Arkadeep
;
Ortiz-Gonzalez, Jose
;
Taha, Mohamed
...
Materials Science Forum. 1091 (2023) - p. 61-66 , 2023
Link:
https://doi.org/10.4028/..
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9
Unclamped inductive stressing of GaN and SiC Cascode power ..:
Gunaydin, Yasin
;
Jahdi, Saeed
;
Yuan, Xibo
...
Microelectronics Reliability. 138 (2022) - p. 114711 , 2022
Link:
https://doi.org/10.1016/..
?
10
FEM-based analysis of avalanche ruggedness of high voltage ..:
Shen, Chengjun
;
Yu, Renze
;
Jahdi, Saeed
...
Microelectronics Reliability. 138 (2022) - p. 114686 , 2022
Link:
https://doi.org/10.1016/..
?
11
Impact of Carriers Injection Level on Transients of Discret..:
Shen, Chengjun
;
Jahdi, Saeed
;
Yang, Juefei
...
IEEE Open Journal of the Industrial Electronics Society. 3 (2022) - p. 65-80 , 2022
Link:
https://doi.org/10.1109/..
?
12
Crosstalk Induced Shoot-Through in BTI-Stressed Symmetrical..:
Yang, Juefei
;
Jahdi, Saeed
;
Stark, Bernard
...
IEEE Open Journal of the Industrial Electronics Society. 3 (2022) - p. 188-202 , 2022
Link:
https://doi.org/10.1109/..
?
13
Prospects and Challenges of 4H-SiC Thyristors in Protection..:
Shen, Chengjun
;
Jahdi, Saeed
;
Alatise, Olayiwola
...
IEEE Open Journal of Power Electronics. 2 (2021) - p. 145-154 , 2021
Link:
https://doi.org/10.1109/..
?
14
Analysis of the 1st and 3rd Quadrant Transients of Symmetri..:
Yang, Juefei
;
Jahdi, Saeed
;
Stark, Bernard
...
IEEE Open Journal of Power Electronics. 2 (2021) - p. 265-276 , 2021
Link:
https://doi.org/10.1109/..
?
15
Performance of Parallel Connected SiC MOSFETs under Short C..:
Wu, Ruizhu
;
Mendy, Simon
;
Agbo, Nereus
...
Energies. 14 (2021) 20 - p. 6834 , 2021
Link:
https://doi.org/10.3390/..
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