Cai, Nian
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1

A Lightweight Method for Detecting IC Wire Bonding Defects ..:

Zhan, Daohua ; Lin, Jian ; Yang, Xiuding...
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC10301426/.  , 2023
 
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Stimulus-Responsive Shrinkage in Electrospun Membranes: Fun..:

Fang, Feiyu ; Wang, Han ; Wang, Huaquan...
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC8401720/.  , 2021
 
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Survey of Reliability Research on 3D Packaged Memory:

Shuai Zhou ; Kaixue Ma ; Yugong Wu...
https://dx.doi.org/10.3390/electronics12122709.  , 2023
 
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