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Hoogenboom, Jacob P
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1

A cryogenic, coincident fluorescence, electron and ion beam..:

Boltje, Daan B ; Hoogenboom, Jacob P ; Jakobi, Arjen J...
https://resolver.caltech.edu/CaltechAUTHORS:20230322-367800000.31.  , 2023
Link: https://doi.org/10.1101/..
 
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2

Introductie Elektriciteit en Magnetisme:

Bouwman, Wim G ; Delft University of Technology, Faculty of Applied Sciences ; Hoogenboom, Jacob P.
https://textbooks.open.tudelft.nl/textbooks/catalog/book/77.  , 2023
Link: https://textbooks.open.t..
 
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3

Integrated Array Tomography for 3D Correlative Light and El..:

Lane, Ryan ; Wolters, Anouk H. G ; Giepmans, Ben N. G.
https://research.rug.nl/en/publications/365905f8-6777-4033-9c2f-66769a7e163f.  , 2022
Link: https://hdl.handle.net/1..
 
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4

Integrated Array Tomography for 3D Correlative Light and El..:

Lane, Ryan ; Wolters, Anouk H. G ; Giepmans, Ben N. G.
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC8809480/.  , 2022
Link: http://www.ncbi.nlm.nih...
 
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5

A cryogenic, coincident fluorescence, electron, and ion bea..:

Boltje, Daan B ; Hoogenboom, Jacob P ; Jakobi, Arjen J...
https://resolver.caltech.edu/CaltechAUTHORS:20230322-367782000.30.  , 2022
Link: https://doi.org/10.7554/..
 
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6

Electron-beam patterned calibration structures for structur..:

Hari, Sangeetha ; Slotman, Johan A ; Vos, Yoram...
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC9684522/.  , 2022
Link: http://www.ncbi.nlm.nih...
 
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7

Retarding Field Integrated Fluorescence and Electron Micros..:

Vos, Yoram ; Lane, Ryan ; Peddie, Chris J..
https://research.rug.nl/en/publications/f26eab68-739b-417c-a564-3a86b9e1e663.  , 2021
Link: https://hdl.handle.net/1..
 
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8

Optimization of negative stage bias potential for faster im..:

Lane, Ryan ; Vos, Yoram ; Wolters, Anouk H.G...
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC7973379/.  , 2021
Link: http://www.ncbi.nlm.nih...
 
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9

Optimization of negative stage bias potential for faster im..:

Lane, Ryan ; Vos, Yoram ; Wolters, Anouk H G...
https://research.rug.nl/en/publications/7c4b3d03-90c4-46fc-aa7d-3a37785115f7.  , 2021
Link: https://hdl.handle.net/1..
 
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10

Electron-Beam Induced Luminescence and Bleaching in Polymer..:

Srinivasa Raja, Aditi ; de Boer, Pascal ; Giepmans, Ben N G.
https://research.rug.nl/en/publications/24f2d227-435c-4827-8db8-5d8159929513.  , 2021
Link: https://hdl.handle.net/1..
 
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11

Lock-in Ultrafast Electron Microscopy Simultaneously Visual..:

Garming, Mathijs W. H ; Bolhuis, Maarten ; Conesa-Boj, Sonia..
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC7569669/.  , 2020
Link: http://www.ncbi.nlm.nih...
 
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12

Photoemission sources and beam blankers for ultrafast elect..:

Zhang, Lixin ; Hoogenboom, Jacob P ; Cook, Ben.
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC6764838/.  , 2019
Link: http://www.ncbi.nlm.nih...
 
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13

Nanoscale Imaging of Light-Matter Coupling Inside Metal-Coa..:

Moerland, Robert J ; Weppelman, I. Gerward C ; Scotuzzi, Marijke.
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC6187523/.  , 2018
Link: http://www.ncbi.nlm.nih...
 
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14

ColorEM:analytical electron microscopy for element-guided i..:

Pirozzi, Nicole M ; Hoogenboom, Jacob P ; Giepmans, Ben N. G
https://research.rug.nl/en/publications/d034a142-6411-4b5d-8ce1-26fd91af1b57.  , 2018
Link: https://hdl.handle.net/1..
 
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15

The 2018 correlative microscopy techniques roadmap:

Ando, Toshio ; Bhamidimarri, Satya Prathyusha ; Brending, Niklas...
https://research.rug.nl/en/publications/35ce9910-2bb6-4072-a728-4413d3a897fc.  , 2018
Link: https://hdl.handle.net/1..
 
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