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Jeon, Dae-Young
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1

Channel-Width-Dependent Mobility Degradation in Bulk Conduc..:

Jeon, Dae-Young ; Mouis, Mireille ; Barraud, Sylvain.
info:eu-repo/semantics/altIdentifier/doi/10.1109/TED.2022.3172056.  , 2022
Link: https://hal.univ-grenobl..
 
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2

Channel-Width-Dependent Mobility Degradation in Bulk Conduc..:

Jeon, Dae-Young ; Mouis, Mireille ; Barraud, Sylvain.
info:eu-repo/semantics/altIdentifier/doi/10.1109/TED.2022.3172056.  , 2022
Link: https://hal.univ-grenobl..
 
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3

Channel-Width-Dependent Mobility Degradation in Bulk Conduc..:

Jeon, Dae-Young ; Mouis, Mireille ; Barraud, Sylvain.
info:eu-repo/semantics/altIdentifier/doi/10.1109/TED.2022.3172056.  , 2022
Link: https://hal.univ-grenobl..
 
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4

Channel-Width-Dependent Mobility Degradation in Bulk Conduc..:

Jeon, Dae-Young ; Mouis, Mireille ; Barraud, Sylvain.
info:eu-repo/semantics/altIdentifier/doi/10.1109/TED.2022.3172056.  , 2022
Link: https://hal.univ-grenobl..
 
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5

Impact of channel length on the operation of junctionless t..:

Jeon, Dae-Young ; Mouis, Mireille ; Barraud, Sylvain.
info:eu-repo/semantics/altIdentifier/doi/10.1109/TED.2021.3069936.  , 2021
Link: https://hal.science/hal-..
 
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6

Impact of channel length on the operation of junctionless t..:

Jeon, Dae-Young ; Mouis, Mireille ; Barraud, Sylvain.
info:eu-repo/semantics/altIdentifier/doi/10.1109/TED.2021.3069936.  , 2021
Link: https://hal.science/hal-..
 
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7

Impact of channel length on the operation of junctionless t..:

Jeon, Dae-Young ; Mouis, Mireille ; Barraud, Sylvain.
info:eu-repo/semantics/altIdentifier/doi/10.1109/TED.2021.3069936.  , 2021
Link: https://hal.science/hal-..
 
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8

Controlling the effective channel thickness of junctionless..:

Jeon, Dae-Young ; Mouis, Mireille ; Barraud, Sylvain.
info:eu-repo/semantics/altIdentifier/doi/10.1109/TED.2020.3020284.  , 2020
Link: https://hal.science/hal-..
 
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9

Channel width dependent subthreshold operation of tri-gate ..:

Jeon, Dae-Young ; Mouis, Mireille ; Barraud, Sylvain.
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.sse.2020.107860.  , 2020
Link: https://hal.univ-grenobl..
 
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10

Channel width dependent subthreshold operation of tri-gate ..:

Jeon, Dae-Young ; Mouis, Mireille ; Barraud, Sylvain.
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.sse.2020.107860.  , 2020
Link: https://hal.univ-grenobl..
 
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11

Controlling the effective channel thickness of junctionless..:

Jeon, Dae-Young ; Mouis, Mireille ; Barraud, Sylvain.
info:eu-repo/semantics/altIdentifier/doi/10.1109/TED.2020.3020284.  , 2020
Link: https://hal.science/hal-..
 
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12

Controlling the effective channel thickness of junctionless..:

Jeon, Dae-Young ; Mouis, Mireille ; Barraud, Sylvain.
info:eu-repo/semantics/altIdentifier/doi/10.1109/TED.2020.3020284.  , 2020
Link: https://hal.science/hal-..
 
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13

Channel width dependent subthreshold operation of tri-gate ..:

Jeon, Dae-Young ; Mouis, Mireille ; Barraud, Sylvain.
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.sse.2020.107860.  , 2020
Link: https://hal.univ-grenobl..
 
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14

A Simple Method for Estimation of Silicon Film Thickness in..:

Jeon, Dae-Young ; Park, So Jeong ; Mouis, Mireille...
info:eu-repo/semantics/altIdentifier/doi/10.1109/LED.2018.2857623.  , 2018
Link: https://hal.science/hal-..
 
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15

Series resistance in different operation regime of junction..:

Jeon, Dae-Young ; Jeon, So Jeong ; Mouis, Mireille...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.sse.2017.12.013.  , 2018
Link: https://hal.science/hal-..
 
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