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Lu, Guo-Neng
69
results:
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english (65)
german (1)
Sorted by: Relevance
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?
1
Fully depleted, trench-pinned photo gate for CMOS image sen..:
Roy, François
;
Suler, Andrej
;
Dalleau, Thomas
...
info:eu-repo/semantics/altIdentifier/doi/10.3390/s20030727. , 2020
Link:
https://hal.science/hal-..
?
2
Fully depleted, trench-pinned photo gate for CMOS image sen..:
Roy, François
;
Suler, Andrej
;
Dalleau, Thomas
...
info:eu-repo/semantics/altIdentifier/doi/10.3390/s20030727. , 2020
Link:
https://hal.science/hal-..
?
3
Analytic modeling of breakdown voltage shift in the CMOS bu..:
Vidal de Negreiros da Silva, Thais Luana
;
Kleimann, Pascal
;
Pittet, Patrick
.
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.sse.2019.107682. , 2020
Link:
https://univ-lyon1.hal.s..
?
4
Analytic modeling of breakdown voltage shift in the CMOS bu..:
Vidal de Negreiros da Silva, Thais Luana
;
Kleimann, Pascal
;
Pittet, Patrick
.
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.sse.2019.107682. , 2020
Link:
https://univ-lyon1.hal.s..
?
5
Fully depleted, trench-pinned photo gate for CMOS image sen..:
Roy, François
;
Suler, Andrej
;
Dalleau, Thomas
...
info:eu-repo/semantics/altIdentifier/doi/10.3390/s20030727. , 2020
Link:
https://hal.science/hal-..
?
6
Fully depleted, trench-pinned photo gate for CMOS image sen..:
Roy, François
;
Suler, Andrej
;
Dalleau, Thomas
...
info:eu-repo/semantics/altIdentifier/doi/10.3390/s20030727. , 2020
Link:
https://hal.science/hal-..
?
7
Fully depleted, trench-pinned photo gate for CMOS image sen..:
Roy, François
;
Suler, Andrej
;
Dalleau, Thomas
...
info:eu-repo/semantics/altIdentifier/doi/10.3390/s20030727. , 2020
Link:
https://hal.science/hal-..
?
8
Analytic modeling of breakdown voltage shift in the CMOS bu..:
Vidal de Negreiros da Silva, Thais Luana
;
Kleimann, Pascal
;
Pittet, Patrick
.
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.sse.2019.107682. , 2020
Link:
https://hal-univ-lyon1.a..
?
9
Analytic modeling of breakdown voltage shift in the CMOS bu..:
Vidal de Negreiros da Silva, Thais Luana
;
Kleimann, Pascal
;
Pittet, Patrick
.
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.sse.2019.107682. , 2020
Link:
https://univ-lyon1.hal.s..
?
10
Fully depleted, trench-pinned photo gate for CMOS image sen..:
Roy, François
;
Suler, Andrej
;
Dalleau, Thomas
...
info:eu-repo/semantics/altIdentifier/doi/10.3390/s20030727. , 2020
Link:
https://hal.science/hal-..
?
11
Fully depleted, trench-pinned photo gate for CMOS image sen..:
Roy, François
;
Suler, Andrej
;
Dalleau, Thomas
...
info:eu-repo/semantics/altIdentifier/doi/10.3390/s20030727. , 2020
Link:
https://hal.science/hal-..
?
12
Analytic modeling of breakdown voltage shift in the CMOS bu..:
Vidal de Negreiros da Silva, Thais Luana
;
Kleimann, Pascal
;
Pittet, Patrick
.
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.sse.2019.107682. , 2020
Link:
https://univ-lyon1.hal.s..
?
13
Fully Depleted, Trench-Pinned Photo Gate for CMOS Image Sen..:
Roy, Francois
;
Suler, Andrej
;
Dalleau, Thomas
...
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC7038367/. , 2020
Link:
http://www.ncbi.nlm.nih...
?
14
Fully depleted, trench-pinned photo gate for CMOS image sen..:
Roy, François
;
Suler, Andrej
;
Dalleau, Thomas
...
info:eu-repo/semantics/altIdentifier/doi/10.3390/s20030727. , 2020
Link:
https://hal.science/hal-..
?
15
Fan-Beam Based Virtual Fluoroscopy for Navigated Catheteriz..:
Guiral, Pierrick
;
Pittet, Patrick
;
Grondin, Yannick
...
info:eu-repo/semantics/altIdentifier/doi/10.3233/SHTI190186. , 2019
Link:
https://hal.science/hal-..
1-15
