Nguyen, Binh X
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7

Deep metric learning meets deep clustering:an novel unsuper..:

Nguyen, Binh X ; Nguyen, Binh D ; Carneiro, Gustavo...
Nguyen , B X , Nguyen , B D , Carneiro , G , Tjiputra , E , Tran , Q D & Do , T-T 2020 , Deep metric learning meets deep clustering : an novel unsupervised approach for feature embedding . in N Campbell (ed.) , 31st British Machine Vision Conference, BMVC 2020 . , 61 , British Machine Vision Association and Society for Pattern Recognition , London UK , British Machine Vision Conference 2020 , London , United Kingdom , 7/09/20 ..  , 2020
 
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Demonstration of a population-based HCV serosurvey in Ho Ch..:

Kim, Thanh V ; Le, Duc H ; Dao, Diem V.B...
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC9283666/.  , 2022
 
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