Pan, Yiyu
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3

Defect Inspection Techniques in SiC:

Chen, Po-Chih ; Miao, Wen-Chien ; Ahmed, Tanveer...
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC8897546/.  , 2022
 
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Defect Inspection Techniques in SiC:

Po-Chih Chen ; Wen-Chien Miao ; Tanveer Ahmed...
https://doi.org/10.1186/s11671-022-03672-w.  , 2022
 
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15

CoNIC Challenge: Pushing the Frontiers of Nuclear Detection..:

The CoNIC Challenge Consortium ; Graham, Simon ; Vu, Quoc Dang...
info:eu-repo/semantics/altIdentifier/doi/10.48550/arXiv.2303.06274.  , 2023
 
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