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Zanoni, Enrico
183
results:
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english (154)
italian (14)
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1
Correlating Interface and Border Traps With Distinctive Fea..:
Zagni, Nicolo'
;
Fregolent, Manuel
;
Verzellesi, Giovanni
...
info:eu-repo/semantics/altIdentifier/wos/WOS:001122852100001. , 2024
Link:
https://hdl.handle.net/1..
?
2
Microwave and Millimeter-Wave GaN HEMTs: Impact of Epitaxia..:
Zanoni, Enrico
;
Santi, Carlo De
;
Gao, Zhan
...
info:eu-repo/semantics/altIdentifier/wos/WOS:001087462000001. , 2024
Link:
https://hdl.handle.net/1..
?
3
TCAD Modeling and Simulation of Dark Current-Voltage Charac..:
Nicoletto, Marco
;
Caria, Alessandro
;
De Santi, Carlo
...
info:eu-repo/semantics/altIdentifier/wos/WOS:001189559000001. , 2024
Link:
https://hdl.handle.net/1..
?
4
III-N optoelectronic devices: understanding the physics of ..:
Meneghini, Matteo
;
Roccato, Nicola
;
Piva, Francesco
...
ispartofbook:Light-Emitting Devices, Materials, and Applications XXVII. , 2023
Link:
https://hdl.handle.net/1..
?
5
Mechanisms of Step-Stress Degradation In Carbon-Doped 0.15 ..:
Zagni, Nicolo'
;
Zhan, Veronica Gao
;
Verzellesi, Giovanni
...
volume:23. , 2023
Link:
https://hdl.handle.net/1..
?
6
Defects in III-N LEDs: experimental identification and impa..:
Buffolo, Matteo
;
Roccato, Nicola
;
Piva, Francesco
...
info:eu-repo/semantics/altIdentifier/isbn/9781510649156. , 2022
Link:
http://hdl.handle.net/11..
?
7
Deep defects in InGaN LEDs: modeling the impact on the elec..:
Roccato, Nicola
;
Piva, Francesco
;
De Santi, Carlo
...
info:eu-repo/semantics/altIdentifier/isbn/9781510648739. , 2022
Link:
http://hdl.handle.net/11..
?
8
GaN-based power devices: Physics, reliability, and perspect..:
Meneghini, Matteo
;
de Santi, Carlo
;
Abid, Idriss
...
info:eu-repo/semantics/altIdentifier/doi/10.1063/5.0061354. , 2021
Link:
https://hal.science/hal-..
?
9
Short term reliability and robustness of ultra-thin barrier..:
Gao, Zhan
;
Meneghini, Matteo
;
Harrouche, Kathia
...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.microrel.2021.114199. , 2021
Link:
https://hal.science/hal-..
?
10
Short term reliability and robustness of ultra-thin barrier..:
Gao, Zhan
;
Meneghini, Matteo
;
Harrouche, Kathia
...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.microrel.2021.114199. , 2021
Link:
https://hal.archives-ouv..
?
11
Inactivating SARS-CoV-2 Using 275 nm UV-C LEDs through a Sp..:
Trivellin, Nicola
;
Buffolo, Matteo
;
Onelia, Francesco
...
info:eu-repo/semantics/altIdentifier/pmid/33946929. , 2021
Link:
http://hdl.handle.net/11..
?
12
GaN-based power devices: Physics, reliability, and perspect..:
Meneghini, Matteo
;
de Santi, Carlo
;
Abid, Idriss
...
info:eu-repo/semantics/altIdentifier/doi/10.1063/5.0061354. , 2021
Link:
https://hal.science/hal-..
?
13
Vertical GaN Devices: Process and Reliability:
You, Shuzhen
;
Geens, Karen
;
Borga, Matteo
...
http://arxiv.org/abs/2107.02469. , 2021
Link:
http://arxiv.org/abs/210..
?
14
Gradual Degradation of InGaAs LEDs: Impact on Non-Radiative..:
Buffolo, Matteo
;
Magri, Alessandro
;
De Santi, Carlo
...
info:eu-repo/semantics/altIdentifier/pmid/33673671. , 2021
Link:
http://hdl.handle.net/11..
?
15
Understanding the Leakage Mechanisms and Breakdown Limits o..:
Mukherjee, Kalparupa
;
De Santi, Carlo
;
Buffolo, Matteo
...
info:eu-repo/grantAgreement/EC/H2020/826392/. , 2021
Link:
https://zenodo.org/recor..
1-15
