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Zjajo, Amir
20
results:
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1
Lärande i arbetet utifrån medarbetares perspektiv : En kval..:
Zjajo, Amir
http://urn.kb.se/resolve?urn=urn:nbn:se:kau:diva-34325. , 2014
Link:
http://urn.kb.se/resolve..
?
2
IC Testing methods and apparatus:
Zjajo, A Amir
;
Barragan Asian, MJ
;
Pineda de Gyvez, J José
, 2012
Link:
http://repository.tue.nl..
?
3
Low-power die-level process variation and temperature monit..:
Zjajo, A Amir
;
Barragan, MJ
;
Pineda de Gyvez, J José
ISSN:0018-9456. , 2012
Link:
http://repository.tue.nl..
?
4
Analog circuit testing and test pattern generation:
Zjajo, A Amir
;
Pineda de Gyvez, J José
;
Gronthoud, AG
, 2012
Link:
http://repository.tue.nl..
?
5
A 1.2V 55mW 12bits self-calibrated dual-residue analog to d..:
Zjajo, A Amir
;
Pineda de Gyvez, J José
, 2011
Link:
http://repository.tue.nl..
?
6
An adaptive digital caliration of multi-step A/D converters:
Zjajo, A Amir
;
Pineda de Gyvez, J José
, 2010
Link:
http://repository.tue.nl..
?
7
Analog IC having test arrangement and test method for such ..:
Zjajo, A Amir
;
Bergveld, HJ Henk Jan
;
Schuttert, RF
. , 2010
Link:
http://repository.tue.nl..
?
8
Design and debugging of multi-step analog to digital conver..:
Zjajo, A Amir
, 2010
Link:
http://repository.tue.nl..
?
9
Analog automatic test pattern generation for quasi-static s..:
Zjajo, A Amir
;
Pineda de Gyvez, J José
ISSN:1063-8210. , 2009
Link:
http://repository.tue.nl..
?
10
Algorithms for ADC multi-site test with digital input stimu..:
Sheng, Xiaoqin
;
Kerkhoff, Hans
;
Zjajo, Amir
.
http://doc.utwente.nl/69800/1/algorithms_for_ADC_multi-site_Test_with_Digital_input_stimulus.pdf. , 2009
Link:
http://purl.utwente.nl/p..
?
11
Efficient estimation of die-level process parameter variati..:
Zjajo, A Amir
;
Krishnan, S
;
Pineda de Gyvez, J José
, 2008
Link:
http://repository.tue.nl..
?
12
Diagnostic Analysis of Static Errors in Multi-Step Analog t..:
Zjajo, A Amir
;
Pineda de Gyvez, J José
, 2008
Link:
http://repository.tue.nl..
?
13
DfT for full accessibility of multi-step analog to digital ..:
Zjajo, A Amir
;
Pineda de Gyvez, J José
, 2008
Link:
http://repository.tue.nl..
?
14
Calibration and Debugging of Multi-Step Analog to Digital C..:
Zjajo, A Amir
;
Pineda de Gyvez, J José
, 2008
Link:
http://repository.tue.nl..
?
15
Analog IC having test arrangement and test method for such ..:
Zjajo, A Amir
;
Bergveld, HJ Henk Jan
;
Schuttert, RF
. , 2007
Link:
http://repository.tue.nl..
1-15