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Abadir, Magdy S
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1

Data Mining In EDA - Basic Principles, Promises, and Constr..:

, In: Proceedings of the 51st Annual Design Automation Conference,
Wang, Li-C. ; Abadir, Magdy S. - p. 1-6 , 2014
Link: https://dl.acm.org/doi/1..
 
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2

Guest Editorial: Test and Verification Challenges for Futur..:

Ray, Sandip ; Bhadra, Jay ; Abadir, Magdy S..
Journal of Electronic Testing.  29 (2013)  5 - p. 621-623 , 2013
Link: https://doi.org/10.1007/..
 
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3

Diagnosis of design-silicon timing mismatch with feature en..:

Bastani, Pouria ; Callegari, Nick ; Wang, Li-C.
IEEE Design & Test.  , 2013
Link: https://doi.org/10.1109/..
 
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4

Introduction to special section on verification challenges ..:

Ray, Sandip ; Bhadra, Jayanta ; Abadir, Magdy S...
ACM Transactions on Design Automation of Electronic Systems (TODAES).  17 (2012)  3 - p. 1-3 , 2012
Link: https://dl.acm.org/doi/1..
 
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5

Novel test detection to improve simulation efficiency : ..:

, In: Proceedings of the International Conference on Computer-Aided Design,
Chen, Wen ; Sumikawa, Nik ; Wang, Li-C.... - p. 101-108 , 2012
Link: https://dl.acm.org/doi/1..
 
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6

Introduction to special section on verification challenges ..:

Ray, Sandip ; Bhadra, Jayanta ; Abadir, Magdy S...
ACM Transactions on Design Automation of Electronic Systems.  17 (2012)  3 - p. 1-3 , 2012
Link: https://doi.org/10.1145/..
 
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7

Important test selection for screening potential customer r..:

, In: Proceedings of 2011 International Symposium on VLSI Design, Automation and Test,
Sumikawa, Nik ; Drmanac, Dragoljub ; Wang, Li-C... - p. 1-4 , 2011
Link: https://doi.org/10.1109/..
 
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8

Feature-Ranking Methodology to Diagnose Design-Silicon Timi..:

Bastani, Pouria ; Callegari, Nick ; Wang, Li-C.
IEEE Design & Test of Computers.  27 (2010)  3 - p. 42-53 , 2010
Link: https://doi.org/10.1109/..
 
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9

Classification rule learning using subgroup discovery of cr..:

, In: Proceedings of the 47th Design Automation Conference,
Callegari, Nicholas ; Drmanac, Dragoljub (Gagi) ; Wang, Li-C.. - p. 374-379 , 2010
Link: https://dl.acm.org/doi/1..
 
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10

Predictive runtime verification of multi-processor SoCs in ..:

, In: Proceedings of the 45th annual Design Automation Conference,
Sen, Alper ; Ogale, Vinit ; Abadir, Magdy S. - p. 948-953 , 2008
Link: https://dl.acm.org/doi/1..
 
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11

Linking Statistical Learning to Diagnosis:

Bastani, Pouria ; Wang, Li-C. ; Abadir, Magdy S.
IEEE Design & Test of Computers.  25 (2008)  3 - p. 232-239 , 2008
Link: https://doi.org/10.1109/..
 
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12

Statistical diagnosis of unmodeled systematic timing effect:

, In: Proceedings of the 45th annual Design Automation Conference,
Bastani, Pouria ; Callegari, Nicholas ; Wang, Li-C.. - p. 355-360 , 2008
Link: https://dl.acm.org/doi/1..
 
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13

Session details: Formal and semi-formal verification techni..:

, In: Proceedings of the 44th annual Design Automation Conference,
Abadir, Magdy S. , 2007
Link: https://dl.acm.org/doi/1..
 
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14

Design-silicon timing correlation : a data mining perspe..:

, In: Proceedings of the 44th annual Design Automation Conference,
Wang, Li-C. ; Bastani, Pouria ; Abadir, Magdy S. - p. 384-389 , 2007
Link: https://dl.acm.org/doi/1..
 
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15

Maximum circuit activity estimation using pseudo-boolean sa..:

, In: Proceedings of the conference on Design, automation and test in Europe,
Mangassarian, Hratch ; Veneris, Andreas ; Safarpour, Sean.. - p. 1538-1543 , 2007
Link: https://dl.acm.org/doi/1..
 
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