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2017 IEEE 35th VLSI Test Symposium (VTS) ,
1
Keynote address tribute to Professor Mel Breuer: Contributi..:
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Proceedings of the 47th Design Automation Conference ,
3
Bridging pre-silicon verification and post-silicon validati..:
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Proceedings of the 5th Annual Workshop on Cyber Security and Information Intelligence Research: Cyber Security and Information Intelligence Challenges and Strategies ,
5
Integrated circuit security : new threats and solutions:
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Proceedings of the 6th IEEE/ACM/IFIP international conference on Hardware/Software codesign and system synthesis ,
7
You can catch more bugs with transaction level honey:
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Proceedings of the 43rd annual Design Automation Conference ,
9
A reconfigurable design-for-debug infrastructure for SoCs:
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Proceedings of the 39th annual Design Automation Conference ,
10
Using embedded FPGAs for SoC yield improvement:
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Proceedings of the 39th annual Design Automation Conference ,
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Low-cost sequential ATPG with clock-control DFT:
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Proceedings of the conference on Design, automation and test in Europe ,
14
FreezeFrame : compact test generation using a frozen clo..:
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Proceedings of the 36th annual ACM/IEEE Design Automation Conference ,
15