Abramovici, Miron
22  results:
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3

Bridging pre-silicon verification and post-silicon validati..:

, In: Proceedings of the 47th Design Automation Conference,
Nahir, Amir ; Ziv, Avi ; Galivanche, Rajesh... - p. 94-95 , 2010
 
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4

We need more standards like IEEE 1500:

Abramovici, Miron ; Crouch, Al
IEEE Design & Test of Computers.  26 (2009)  1 - p. 104-104 , 2009
 
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5

Integrated circuit security : new threats and solutions:

, In: Proceedings of the 5th Annual Workshop on Cyber Security and Information Intelligence Research: Cyber Security and Information Intelligence Challenges and Strategies,
Abramovici, Miron ; Bradley, Paul - p. 1-3 , 2009
 
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6

In-System Silicon Validation and Debug:

Abramovici, Miron
IEEE Design & Test of Computers.  25 (2008)  3 - p. 216-223 , 2008
 
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7

You can catch more bugs with transaction level honey:

, In: Proceedings of the 6th IEEE/ACM/IFIP international conference on Hardware/Software codesign and system synthesis,
Abramovici, Miron ; Goossens, Kees ; Vermeulen, Bart... - p. 121-124 , 2008
 
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8

Online Fault Tolerance for FPGA Logic Blocks:

Emmert, John M. ; Stroud, Charles E. ; Abramovici, Miron
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  15 (2007)  2 - p. 216-226 , 2007
 
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9

A reconfigurable design-for-debug infrastructure for SoCs:

, In: Proceedings of the 43rd annual Design Automation Conference,
 
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10

Using embedded FPGAs for SoC yield improvement:

, In: Proceedings of the 39th annual Design Automation Conference,
 
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11

Low-cost sequential ATPG with clock-control DFT:

, In: Proceedings of the 39th annual Design Automation Conference,
 
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12

FILL and FUNI : algorithms to identify illegal states an..:

Long, David E. ; Iyer, Mahesh A. ; Abramovici, Miron
ACM Transactions on Design Automation of Electronic Systems (TODAES).  5 (2000)  3 - p. 631-657 , 2000
 
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13

FILL and FUNI: algorithms to identify illegal states and se..:

Long, David E. ; Iyer, Mahesh A. ; Abramovici, Miron
ACM Transactions on Design Automation of Electronic Systems.  5 (2000)  3 - p. 631-657 , 2000
 
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14

FreezeFrame : compact test generation using a frozen clo..:

, In: Proceedings of the conference on Design, automation and test in Europe,
 
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15

A massively-parallel easily-scalable satisfiability solver ..:

, In: Proceedings of the 36th annual ACM/IEEE Design Automation Conference,
 
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