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Acharya, Lomash Chandra
17  results:
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1

Switching Activity Factor-Based ECSM Characterization (SAFE..:

Acharya, Lomash Chandra ; Sharma, Arvind ; Mishra, Neeraj...
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.  , 2024
Link: https://doi.org/10.1109/..
 
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2

Unveiling the mechanism behind the negative capacitance eff..:

Singh, Khoirom Johnson ; Acharya, Lomash Chandra ; Bulusu, Anand.
Solid-State Electronics.  216 (2024)  - p. 108932 , 2024
Link: https://doi.org/10.1016/..
 
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3

Exploring the impact of domain numbers on negative capacita..:

Singh, Khoirom Johnson ; Acharya, Lomash Chandra ; Bulusu, Anand.
Solid-State Electronics.  210 (2023)  - p. 108792 , 2023
Link: https://doi.org/10.1016/..
 
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4

Beyond SPICE Simulation: A Novel Variability-Aware STA Meth..:

, In: 2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD),
Acharya, Lomash Chandra ; Kumar, Anubhav ; Singh, Khoirom Johnson... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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5

Generalized Edge Propagation and Multi-Band Frequency Switc..:

Mishra, Neeraj ; Proch, Anchit ; Acharya, Lomash Chandra..
IEEE Transactions on Circuits and Systems II: Express Briefs.  70 (2023)  9 - p. 3609-3613 , 2023
Link: https://doi.org/10.1109/..
 
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6

Aging-Aware Timing Model of CMOS Inverter: Path Level Timin..:

Acharya, Lomash Chandra ; Kumar Sharma, Arvind ; Mishra, Neeraj...
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.  42 (2023)  8 - p. 2657-2663 , 2023
Link: https://doi.org/10.1109/..
 
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7

Negative capacitance gate stack and Landau FET-based voltag..:

Singh, Khoirom Johnson ; Acharya, Lomash Chandra ; Bulusu, Anand.
Microelectronics Journal.  142 (2023)  - p. 105981 , 2023
Link: https://doi.org/10.1016/..
 
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8

ABB Assisted Area Efficient Vernier Delay Line Time-to-Digi..:

, In: 2023 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS),
Ravi ; Acharya, Lomash Chandra ; Dargupally, Mahipal... - p. 100-104 , 2023
Link: https://doi.org/10.1109/..
 
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9

An Efficient Standard Cell Design Methodology by Exploiting..:

, In: 2023 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS),
Dargupally, Mahipal ; Acharya, Lomash Chandra ; Singh, Khoirom Johnson... - p. 105-109 , 2023
Link: https://doi.org/10.1109/..
 
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10

Significance of Organic Ferroelectric in Harnessing Transie..:

, In: 2022 IEEE International Symposium on Circuits and Systems (ISCAS),
Singh, Khoirom Johnson ; Acharya, Lomash Chandra ; Bulusu, Anand. - p. 3423-3427 , 2022
Link: https://doi.org/10.1109/..
 
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11

Post-CMOS Devices: Landau's Anisotropy Sensitivity Analyses..:

, In: 2022 IEEE Latin American Electron Devices Conference (LAEDC),
Singh, Khoirom Johnson ; Acharya, Lomash Chandra ; Dargupally, Mahipal.. - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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12

Phase Noise Analysis of Separately Driven Ring Oscillators:

Mishra, Neeraj ; Proch, Anchit ; Acharya, Lomash Chandra...
IEEE Transactions on Circuits and Systems I: Regular Papers.  69 (2022)  11 - p. 4415-4428 , 2022
Link: https://doi.org/10.1109/..
 
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13

Prediction of variation aware F in ring oscillators (ROs) t..:

Lomash Chandra Acharya ; Singh, Khoirom Johnson ; Gupta, Neha...
Solid-State Electronics.  210 (2023)  - p. 108790 , 2023
Link: https://doi.org/10.1016/..
 
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14

Impact of S/D Extension Length and Sheet Stacking on Transi..:

, In: 2024 IEEE International Symposium on Circuits and Systems (ISCAS),
Srivastava, Shobhit ; Doge, Sachin ; Panwar, Sourabh... - p. 1-4 , 2024
Link: https://doi.org/10.1109/..
 
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15

Influences of Source/Drain Extension Region on Thermal Beha..:

Srivastava, Shobhit ; Panwar, Sourabh ; Shashidhara, M....
IEEE Transactions on Electron Devices.  71 (2024)  3 - p. 2171-2176 , 2024
Link: https://doi.org/10.1109/..
 
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