E-LIB Suche - Ergebnisse für: Afanas'ev, Valeri V.

1

Resolving the discrepancy between coercive voltages extract..:

Mukherjee, Shankha ; Bizindavyi, Jasper ; Clima, Sergiu...
Solid-State Electronics. 212 (2024) - p. 108834 , 2024

Link: https://doi.org/10.1016/..

2

A Theoretical Analysis of Ferroelectric Switching Physics i..:

Chen, Zhuo ; Ronchi, Nicolò ; Tang, Hongwei...
IEEE Electron Device Letters. , 2024

Link: https://doi.org/10.1109/..

3

Capacitive Memory Window With Non-Destructive Read in Ferro..:

Mukherjee, Shankha ; Bizindavyi, Jasper ; Clima, Sergiu...
IEEE Electron Device Letters. 44 (2023) 7 - p. 1092-1095 , 2023

Link: https://doi.org/10.1109/..

4

Electron trapping in ferroelectric HfO2:

Izmailov, Roman A. ; Strand, Jack W. ; Larcher, Luca...
Physical Review Materials. 5 (2021) 3 - p. , 2021

Link: https://doi.org/10.1103/..

5

Energy Band Alignment of Few-Monolayer WS2 and WSe2 with Si..:

Delie, Gilles ; Litwin, Peter M. ; McDonnell, Stephen J....
ECS Journal of Solid State Science and Technology. 9 (2020) 9 - p. 093009 , 2020

Link: https://doi.org/10.1149/..

6

Analysis of Oxygen and Nitrogen Redistribution at Interface..:

Konashuk, Aleksei S. ; Filatova, Elena O. ; Sakhonenkov, Sergei S...
The Journal of Physical Chemistry C. 124 (2020) 29 - p. 16171-16176 , 2020

Link: https://doi.org/10.1021/..

7

Mechanisms of TiN Effective Workfunction Tuning at Interfac..:

Filatova, Elena O. ; Konashuk, Aleksei S. ; Sakhonenkov, Sergei S....
The Journal of Physical Chemistry C. 124 (2020) 28 - p. 15547-15557 , 2020

Link: https://doi.org/10.1021/..

8

Inhibition of Oxygen Scavenging by TiN at the TiN/SiO2 Inte..:

Filatova, Elena O. ; Sakhonenkov, Sergei S. ; Konashuk, Aleksei S...
The Journal of Physical Chemistry C. 123 (2019) 36 - p. 22335-22344 , 2019

Link: https://doi.org/10.1021/..

9

Material-Selective Doping of 2D TMDC through AlxOy Encapsul..:

Leonhardt, Alessandra ; Chiappe, Daniele ; Afanas'ev, Valeri V....
ACS Applied Materials & Interfaces. 11 (2019) 45 - p. 42697-42707 , 2019

Link: https://doi.org/10.1021/..

10

The origin of negative charging in amorphous Al2O3 films: t..:

Dicks, Oliver A ; Cottom, Jonathon ; Shluger, Alexander L.
Nanotechnology. 30 (2019) 20 - p. 205201 , 2019

Link: https://doi.org/10.1088/..

11

Silicene on non-metallic substrates: Recent theoretical and..:

Scalise, Emilio ; Iordanidou, Kostantina ; Afanas'ev, Valeri V...
Nano Research. 11 (2018) 3 - p. 1169-1182 , 2018

Link: https://doi.org/10.1007/..

12

Intrinsic electron trapping in amorphous oxide:

Strand, Jack ; Kaviani, Moloud ; Afanas'ev, Valeri V..
Nanotechnology. 29 (2018) 12 - p. 125703 , 2018

Link: https://doi.org/10.1088/..

13

Intrinsic charge trapping in amorphous oxide films: status ..:

Strand, Jack ; Kaviani, Moloud ; Gao, David...
Journal of Physics: Condensed Matter. 30 (2018) 23 - p. 233001 , 2018

Link: https://doi.org/10.1088/..

14

Erratum to: Silicene on non-metallic substrates: Recent the..:

Scalise, Emilio ; Iordanidou, Konstantina ; Afanas'ev, Valeri V...
Nano Research. 11 (2018) 3 - p. 1755-1755 , 2018

Link: https://doi.org/10.1007/..

15

(Invited) Probing Dopants in 2H MoS2Crystals and 2D Layers ..:

Stesmans, Andre ; Iacovo, Serena ; Schoenaers, Ben..
ECS Transactions. 80 (2017) 1 - p. 177-189 , 2017

Link: https://doi.org/10.1149/..