Agarwal, Akshay
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3

Benchmarking Image Classifiers for Physical Out-of-Distribu..:

, In: 2023 IEEE/CVF International Conference on Computer Vision Workshops (ICCVW),
Ojaswee ; Agarwal, Akshay ; Ratha, Nalini - p. 4429-4437 , 2023
 
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4

Continuous-Time Modeling and Analysis of Particle Beam Metr..:

Agarwal, Akshay ; Peng, Minxu ; Goyal, Vivek K
IEEE Journal on Selected Areas in Information Theory.  4 (2023)  - p. 61-74 , 2023
 
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6

Progress in Secondary Electron Yield Mapping in Charged Par..:

Agarwal, Akshay ; Kasaei, Leila ; Schultz, Albert..
Microscopy and Microanalysis.  29 (2023)  Supplement_1 - p. 741-742 , 2023
 
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8

Robustness Against Gradient based Attacks through Cost Effe..:

, In: 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW),
Agarwal, Akshay ; Ratha, Nalini ; Singh, Richa. - p. 28-37 , 2023
 
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10

Benchmarking Robustness Beyond $$l_p$$ Norm Adversaries:

, In: Lecture Notes in Computer Science; Computer Vision – ECCV 2022 Workshops,
Agarwal, Akshay ; Ratha, Nalini ; Vatsa, Mayank. - p. 342-359 , 2023
 
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11

Attention Guided Multi-attribute Architecture For Deepfake ..:

, In: 2023 IEEE Western New York Image and Signal Processing Workshop (WNYISPW),
 
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12

Fourier-ring Correlation Resolution for Time-resolved Measu..:

Hitit, Oguz Kagan ; Agarwal, Akshay ; Goyal, Vivek
Microscopy and Microanalysis.  29 (2023)  Supplement_1 - p. 730-731 , 2023
 
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13

Misclassifications of Contact Lens Iris PAD Algorithms: Is ..:

, In: 2023 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV),
Agarwal, Akshay ; Ratha, Nalini ; Noore, Afzel.. - p. 961-970 , 2023
 
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14

IBAttack: Being Cautious About Data Labels:

Agarwal, Akshay ; Singh, Richa ; Vatsa, Mayank.
IEEE Transactions on Artificial Intelligence.  4 (2023)  6 - p. 1484-1493 , 2023
 
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