Search for persons
X
?
2007 IEEE Symposium on VLSI Technology ,
2
Stress dependence and poly-pitch scaling characteristics of..:
, In:
?
2006 International Electron Devices Meeting ,
3
High Performance 45-nm SOI Technology with Enhanced Strain,..:
, In:
?
IEEE International Electron Devices Meeting 2003 ,
4
High performance CMOS devices on SOI for 90 nm technology e..:
, In:
?
30th Annual Proceedings Reliability Physics 1992 ,
12