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Agocs, E.
351
results:
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Online (351)
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Articles (Online) (86)
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?
1
Optical properties of Zr and ZrO2:
Petrik, P.
;
Sulyok, A.
;
Novotny, T.
...
Applied Surface Science. 421 (2017) - p. 744-747 , 2017
Link:
https://doi.org/10.1016/..
?
2
Optical and structural characterization of Ge clusters embe..:
Agocs, E.
;
Zolnai, Z.
;
Rossall, A.K.
...
Applied Surface Science. 421 (2017) - p. 283-288 , 2017
Link:
https://doi.org/10.1016/..
?
3
Protein adsorption monitored by plasmon-enhanced semi-cylin..:
Kalas, B.
;
Nador, J.
;
Agocs, E.
...
Applied Surface Science. 421 (2017) - p. 585-592 , 2017
Link:
https://doi.org/10.1016/..
?
4
Nanophotonics of biomaterials and inorganic nanostructures:
Petrik, P
;
Agocs, E
;
Kalas, B
...
Journal of Physics: Conference Series. 794 (2017) - p. 012004 , 2017
Link:
https://doi.org/10.1088/..
?
5
Optical characterization of macro-, micro- and nanostructur..:
Petrik, P
;
Kumar, N
;
Juhasz, G
...
Journal of Physics: Conference Series. 558 (2014) - p. 012008 , 2014
Link:
https://doi.org/10.1088/..
?
6
Resolving lateral and vertical structures by ellipsometry u..:
Petrik, P.
;
Agocs, E.
;
Volk, J.
...
Thin Solid Films. 571 (2014) - p. 579-583 , 2014
Link:
https://doi.org/10.1016/..
?
7
Approaches to calculate the dielectric function of ZnO arou..:
Agocs, E.
;
Fodor, B.
;
Pollakowski, B.
...
Thin Solid Films. 571 (2014) - p. 684-688 , 2014
Link:
https://doi.org/10.1016/..
?
8
Spectroellipsometric and ion beam analytical studies on a g..:
Lohner, T.
;
Agócs, E.
;
Petrik, P.
...
Thin Solid Films. 571 (2014) - p. 715-719 , 2014
Link:
https://doi.org/10.1016/..
?
9
Characterization of in-depth cavity distribution after ther..:
Fodor, B.
;
Cayrel, F.
;
Agocs, E.
...
Thin Solid Films. 571 (2014) - p. 567-572 , 2014
Link:
https://doi.org/10.1016/..
?
10
Comparative measurements on atomic layer deposited Al2O3 th..:
Petrik, P.
;
Gumprecht, T.
;
Nutsch, A.
...
Thin Solid Films. 541 (2013) - p. 131-135 , 2013
Link:
https://doi.org/10.1016/..
?
11
Characterization of damage structure in ion implanted SiC u..:
Petrik, P.
;
Zolnai, Z.
;
Polgar, O.
...
Thin Solid Films. 519 (2011) 9 - p. 2791-2794 , 2011
Link:
https://doi.org/10.1016/..
?
12
Optical characterization of nanocrystals in silicon rich ox..:
Agocs, E.
;
Petrik, P.
;
Milita, S.
...
Thin Solid Films. 519 (2011) 9 - p. 3002-3005 , 2011
Link:
https://doi.org/10.1016/..
?
13
Optical constants of MOCVD-grown Aurivillius phases in the ..:
Bin Anooz, S.
;
Schwarzkopf, J.
;
Petrik, P.
...
Applied Physics A. 105 (2011) 1 - p. 81-88 , 2011
Link:
https://doi.org/10.1007/..
?
14
Spectroscopic ellipsometry studies on the optical constants..:
Bin Anooz, S.
;
Schwarzkopf, J.
;
Dirsyte, R.
...
Thin Solid Films. 519 (2011) 11 - p. 3782-3788 , 2011
Link:
https://doi.org/10.1016/..
?
15
Effect of nano-quasicrystals on viscosity of a Zr-based bul..:
Gubicza, J.
;
Lábár, J.L.
;
Agócs, E.
..
Scripta Materialia. 58 (2008) 4 - p. 291-294 , 2008
Link:
https://doi.org/10.1016/..
1-15