Ahlawat, Satyadev
15  results:
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3

On Evaluating the Security of Dynamic Scan Obfuscation Sche..:

, In: 2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS),
 
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4

TSPD: A Robust Online Time Series Two-Stage Peak Detection ..:

, In: 2023 IEEE International Conference on Service-Oriented System Engineering (SOSE),
 
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5

On Protecting IJTAG using an Inherently Secure SIB:

, In: 2023 IFIP/IEEE 31st International Conference on Very Large Scale Integration (VLSI-SoC),
Riaz, Anjum ; Kumar, Gaurav ; Kumar, Pardeep.. - p. 1-6 , 2023
 
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7

On Protecting IJTAG from Data Sniffing and Alteration Attac..:

, In: 2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI),
Riaz, Anjum ; Kumar, Gaurav ; Tudu, Jaynarayan. - p. 146-151 , 2022
 
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8

Low Cost Implementation of Deep Neural Network on Hardware:

, In: Communications in Computer and Information Science; VLSI Design and Test,
Kumar, Gaurav ; Kumar, Anuj ; Ahlawat, Satyadev. - p. 584-594 , 2022
 
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9

On Attacking IJTAG Architecture based on Locking SIB with S..:

, In: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS),
 
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10

On Attacking Locking SIB based IJTAG Architecture:

, In: Proceedings of the Great Lakes Symposium on VLSI 2022,
Kumar, Gaurav ; Riaz, Anjum ; Prasad, Yamuna. - p. 105-109 , 2022
 
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11

A New Access Protocol for Elevating the Security of IJTAG N..:

, In: 2022 IEEE 31st Asian Test Symposium (ATS),
Kumar, Gaurav ; Riaz, Anjum ; Prasad, Yamuna. - p. 31-36 , 2022
 
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12

Power Analysis Attack on Locking SIB based IJTAG Achitectur:

, In: 2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC),
 
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15

Preventing Scan Attack through Test Response Encryption:

, In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
 
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