E-LIB Suche - Ergebnisse für: Ahmed, Soyed Mohiuddin

1

LED Illumination for High-Quality High-Yield Crop Growth in..:

Rahman, Md Momtazur ; Field, David Luke ; Ahmed, Soyed Mohiuddin...
Plants. 10 (2021) 11 - p. 2470 , 2021

Link: https://doi.org/10.3390/..

2

Energy Engineering Approach for Rural Areas Cattle Farmers ..:

Nur-E-Alam, Mohammad ; Hoque, Mohammad Nasirul ; Ahmed, Soyed Mohiuddin..
Sustainability. 12 (2020) 20 - p. 8609 , 2020

Link: https://doi.org/10.3390/..

3

Energy engineering approach for rural areas cattle farmers ..:

Nur-E-Alam, Mohammad ; Hoque, Mohammad Nasirul ; Ahmed, Soyed Mohiuddin..
https://ro.ecu.edu.au/ecuworkspost2013/9124. , 2020

Link: https://ro.ecu.edu.au/ec..

4

LED Illumination for High-Quality High-Yield Crop Growth in..:

Md Momtazur Rahman ; David Luke Field ; Soyed Mohiuddin Ahmed...
https://www.mdpi.com/2223-7747/10/11/2470. , 2021

Link: https://doi.org/10.3390/..

5

LED Illumination for High-Quality High-Yield Crop Growth in..:

Md Momtazur Rahman ; David Luke Field ; Soyed Mohiuddin Ahmed...
https://dx.doi.org/10.3390/plants10112470. , 2021

Link: https://doi.org/10.3390/..

6

Energy Engineering Approach for Rural Areas Cattle Farmers ..:

Mohammad Nur-E-Alam ; Mohammad Nasirul Hoque ; Soyed Mohiuddin Ahmed..
https://www.mdpi.com/2071-1050/12/20/8609. , 2020

Link: https://doi.org/10.3390/..

7

Energy Engineering Approach for Rural Areas Cattle Farmers ..:

Mohammad Nur-E-Alam ; Mohammad Nasirul Hoque ; Soyed Mohiuddin Ahmed..
Environmental Sustainability and Applications. , 2020

Link: https://doi.org/10.3390/..

8

One-Shot Online Testing of Deep Neural Networks Based On Di..:

Ahmed, Soyed Tuhin ; Tahoori, Mehdi B.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. , 2024

Link: https://doi.org/10.1109/..

9

NN-ECC: Embedding Error Correction Codes in Neural Network ..:

, In: 2024 IEEE 42nd VLSI Test Symposium (VTS),

Ahmed, Soyed Tuhin ; Hemaram, Surendra ; Tahoori, Mehdi B. - p. 1-7 , 2024

Link: https://doi.org/10.1109/..

10

Testing Spintronics Implemented Monte Carlo Dropout-Based B..:

, In: 2024 IEEE European Test Symposium (ETS),

Ahmed, Soyed Tuhin ; Danouchi, Kamal ; Hefenbrock, Michael... - p. 1-6 , 2024

Link: https://doi.org/10.1109/..

11

Design-time Reference Current Generation for Robust Spintro..:

Ahmed, Soyed Tuhin ; Mayahinia, Mahta ; Hefenbrock, Michael..
ACM Journal on Emerging Technologies in Computing Systems. 20 (2023) 1 - p. 1-20 , 2023

Link: https://doi.org/10.1145/..

12

A Low Overhead Checksum Technique for Error Correction in M..:

, In: 2023 IEEE 41st VLSI Test Symposium (VTS),

Hemaram, Surendra ; Ahmed, Soyed Tuhin ; Mayahinia, Mahta.. - p. 1-7 , 2023

Link: https://doi.org/10.1109/..

13

SpinDrop: Dropout-Based Bayesian Binary Neural Networks Wit..:

Ahmed, Soyed Tuhin ; Danouchi, Kamal ; Münch, Christopher...
IEEE Journal on Emerging and Selected Topics in Circuits and Systems. 13 (2023) 1 - p. 150-164 , 2023

Link: https://doi.org/10.1109/..

14

Online Fault-Tolerance for Memristive Neuromorphic Fabric B..:

, In: 2023 IEEE European Test Symposium (ETS),

Ahmed, Soyed Tuhin ; Rakhmatullin, Roman ; Tahoori, Mehdi B. - p. 1-4 , 2023

Link: https://doi.org/10.1109/..

15

NeuroScrub+: Mitigating Retention Faults Using Flexible App..:

Ahmed, Soyed Tuhin ; Hefenbrock, Michael ; Münch, Christopher.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 42 (2023) 5 - p. 1490-1503 , 2023

Link: https://doi.org/10.1109/..