Aik Boo, Kelvin Tan
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Effect of Underfill on Substrate Trace Crack under PTC:

, In: 2023 IEEE 25th Electronics Packaging Technology Conference (EPTC),
Yu, Wei ; Pan, Ling ; Aik Boo, Kelvin Tan... - p. 678-682 , 2023
 
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2

Design Optimization to Boost Solder Joint Reliability Perfo..:

, In: 2023 IEEE 25th Electronics Packaging Technology Conference (EPTC),
Pan, Ling ; Che, Fa Xing ; Yu, Wei... - p. 674-677 , 2023
 
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