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Arnaud, Franck
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1

An 18nm ePCM with BJT selector NVM design for advanced micr..:

, In: 2023 IEEE International Memory Workshop (IMW),
Conte, Antonino ; Tomaiuolo, Francesco ; Ruta, Marco... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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2

A tunable and versatile 28 nm FD-SOI crossbar output circui..:

Palhares, Joao Henrique Quintino ; Beilliard, Yann ; Sandrini, Jury...
Solid-State Electronics.  209 (2023)  - p. 108779 , 2023
Link: https://doi.org/10.1016/..
 
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3

Strained Silicon-on-Insulator Platform for Co-Integration o..:

Liang, Jie ; Sun, Chen ; Xu, Haiwen...
IEEE Transactions on Electron Devices.  69 (2022)  4 - p. 1769-1775 , 2022
Link: https://doi.org/10.1109/..
 
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4

18nm FDSOI Enhanced Device Platform for ULP/ULL MCUs:

, In: 2022 International Electron Devices Meeting (IEDM),
Weber, Olivier ; Min, Doohong ; Villaret, Alexandre... - p. 27.2.1-27.2.4 , 2022
Link: https://doi.org/10.1109/..
 
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5

18nm FDSOI Technology Platform embedding PCM & Innovative C..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Min, Doohong ; Park, Jinha ; Weber, Olivier... - p. 13.1.1-13.1.4 , 2021
Link: https://doi.org/10.1109/..
 
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6

Front and back channels coupling and transport on 28 nm FD-..:

Paz, Bruna Cardoso ; Cassé, Mikaël ; Haendler, Sebastien...
Solid-State Electronics.  186 (2021)  - p. 108071 , 2021
Link: https://doi.org/10.1016/..
 
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7

FD-SOI Technology:

, In: Integrated Circuits and Systems; The Fourth Terminal,
Arnaud, Franck - p. 9-57 , 2020
Link: https://doi.org/10.1007/..
 
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8

Enabling UTBB Strained SOI Platform for Co-integration of L..:

, In: 2020 IEEE Symposium on VLSI Technology,
Sun, Chen ; Liang, Jie ; Xu, Haiwen... - p. 1-2 , 2020
Link: https://doi.org/10.1109/..
 
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9

Phase change memory for automotive grade embedded NVM appli..:

Cappelletti, Paolo ; Annunziata, Roberto ; Arnaud, Franck...
Journal of Physics D: Applied Physics.  53 (2020)  19 - p. 193002 , 2020
Link: https://doi.org/10.1088/..
 
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10

Characterization Challenges and Solutions for FDSOI Technol..:

, In: 2019 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S),
Brozek, Tomasz ; Lunenborg, Meindert ; Arnaud, Franck... - p. 1-3 , 2019
Link: https://doi.org/10.1109/..
 
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11

A Path to Energy Efficiency and Reliability for ICs: Fully ..:

Nguyen, Bich-Yen ; Flatresse, Philippe ; Schaeffer, Jamie...
IEEE Solid-State Circuits Magazine.  10 (2018)  4 - p. 24-33 , 2018
Link: https://doi.org/10.1109/..
 
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12

Novel High-Performance Analog Devices for Advanced Low-Powe..:

Han, Jin-Ping ; Shimizu, Takashi ; Pan, Li-Hong...
Japanese Journal of Applied Physics.  50 (2011)  4S - p. 04DC13 , 2011
Link: https://doi.org/10.1143/..
 
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13

Novel High-Performance Analog Devices for Advanced Low-Powe..:

Han, Jin-Ping ; Shimizu, Takashi ; Pan, Li-Hong...
Japanese Journal of Applied Physics.  50 (2011)  4S - p. 04DC13 , 2011
Link: https://doi.org/10.7567/..
 
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14

Accélération de l'activité:

, In: Problèmes économiques / Direction de la Documentation Française
Arnaud, Franck ; Aviat, Antonin ; Friez, Adrien. (2007)  - p. 12-16
Copies:  Zentrale:Magazin Zs fe 5995
 
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15

Mechanisms of stress generation within a polysilicon gate f..:

Morin, Pierre ; Ortolland, Claude ; Mastromatteo, Eric..
Materials Science and Engineering: B.  135 (2006)  3 - p. 215-219 , 2006
Link: https://doi.org/10.1016/..
 
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