Ashida, Koji
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1

Evaluation of growth sector orientation changes of high B d..:

Matsushita, Akio ; Tsuchida, Yuki ; Matsuoka, Minori...
Japanese Journal of Applied Physics.  58 (2019)  6 - p. 065504 , 2019
 
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Detection of Defects on SiC Substrate by SEM and Classifica..:

, In: Advances in Intelligent Networking and Collaborative Systems; Lecture Notes on Data Engineering and Communications Technologies,
 
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14

Tip-Enhanced Raman Scattering of the Local Nanostructure of..:

Vantasin, Sanpon ; Tanabe, Ichiro ; Tanaka, Yoshito...
The Journal of Physical Chemistry C.  118 (2014)  44 - p. 25809-25815 , 2014
 
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