Aspnes, David E.
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2

Reducing or eliminating noise in ellipsometric spectra:

Le, Long V. ; Kim, Tae Jung ; Kim, Young Dong.
Journal of the Korean Physical Society.  81 (2022)  5 - p. 403-408 , 2022
 
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5

Dielectric Functions and Critical Points of GaAsSb Alloys:

Kim, Tae Jung ; Park, Han Gyeol ; Byun, Jun Seok...
Journal of the Korean Physical Society.  74 (2019)  6 - p. 595-599 , 2019
 
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10

Measurement and control of in-plane surface chemistry durin..:

Gokce, Bilal ; Adles, Eric J. ; Aspnes, David E..
Proceedings of the National Academy of Sciences of the United States of America.  107 (2010)  41 - p. 17503-17508 , 2010
 
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11

Measurement and control of in-plane surface chemistry durin..:

Gokce, Bilal ; Adles, Eric J. ; Aspnes, David E..
Proceedings of the National Academy of Sciences.  107 (2010)  41 - p. 17503-17508 , 2010
 
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12

Detection and analysis of depolarization artifacts in rotat..:

Li, ShiFang ; Opsal, Jon ; Chu, Hanyou.
Journal of the Optical Society of America A.  18 (2001)  2 - p. 426 , 2001
 
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13

Effect of Ar+ ion beam in the process of plasma surface mod..:

Hyun, Jinho ; Barletta, Philip ; Koh, Kwangok...
Journal of Applied Polymer Science.  77 (2000)  8 - p. 1679-1683 , 2000
 
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15

Second indirect band gap in silicon:

Forman, Richard A. ; Robert Thurber, W. ; Aspnes, David E.
Solid State Communications.  14 (1974)  10 - p. 1007-1010 , 1974
 
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