Gallud, Audrey ;
Delaval, Mathilde ;
Kinaret, Pia...
Gallud , A , Delaval , M , Kinaret , P , Singh Marwah , V , Fortino , V , Ytterberg , J , Zubarev , R , Skoog , T , Kere , J , Correia , M , Loeschner , K , Al-Ahmady , Z S , Kostarelos , K , Ruiz , J , Astruc , D , Monopoli , M , Handy , R D , Moya , S , Savolainen , K , Alenius , H , Greco , D & Fadeel , B 2020 , ' Multiparametric profiling of engineered nanomaterials : Unmasking the surface coating effect ' , Advanced Science , vol. 7 , 2002221 , pp. 1-18 . https://doi.org/10.1002/advs.202002221.
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2020