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2023 IFIP/IEEE 31st International Conference on Very Large Scale Integration (VLSI-SoC) ,
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A Novel Approach to Extract Embedded Memory Design Paramete..:
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2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS) ,
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About the Correlation between Logical Identified Faulty Gat..:
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2022 IEEE European Test Symposium (ETS) ,
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Optimized diagnostic strategy for embedded memories of Auto..:
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2022 IEEE International Test Conference (ITC) ,
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An innovative Strategy to Quickly Grade Functional Test Pro..:
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2022 IEEE European Test Symposium (ETS) ,
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An Optimized Burn-In Stress Flow targeting Interconnections..:
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2022 IEEE 31st International Symposium on Industrial Electronics (ISIE) ,
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A novel SEU injection setup for Automotive SoC:
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2022 IEEE European Test Symposium (ETS) ,
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Test, Reliability and Functional Safety Trends for Automoti..:
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2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS) ,
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Recent Trends and Perspectives on Defect-Oriented Testing:
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2022 IEEE 23rd Latin American Test Symposium (LATS) ,
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