E-LIB Suche - Ergebnisse für: Bachurin, V. I.

1

Electrolyte–Plasma Cathodic Exfoliation of Graphite:

Grushevskii, E. A. ; Savinskii, N. G. ; Bachurin, V. I.
Bulletin of the Russian Academy of Sciences: Physics. 88 (2024) 4 - p. 485-490 , 2024

Link: https://doi.org/10.1134/..

2

Study of the topography of silicon surface evolution under ..:

Smirnova, M.A. ; Bachurin, V.I. ; Lebedev, M.E....
Vacuum. 203 (2022) - p. 111238 , 2022

Link: https://doi.org/10.1016/..

3

Formation of Nanoscale Anodized Aluminum Oxide Matrices via..:

Grushevski, E. A. ; Savinski, N. G. ; Bachurin, V. I..
Bulletin of the Russian Academy of Sciences: Physics. 86 (2022) 5 - p. 552-555 , 2022

Link: https://doi.org/10.3103/..

4

Electrophoretic Deposition and Structural Analysis of Nanog..:

Savelyev, D. N. ; Grushevski, E. A. ; Smirnova, M. A....
Bulletin of the Russian Academy of Sciences: Physics. 86 (2022) 5 - p. 556-561 , 2022

Link: https://doi.org/10.3103/..

5

Study of ripple formation on Si surface under Ga ion beam b..:

Smirnova, M A ; Ivanov, A S ; Bachurin, V I.
Journal of Physics: Conference Series. 2086 (2021) 1 - p. 012210 , 2021

Link: https://doi.org/10.1088/..

6

Surface erosion by moving ion beam:

Rudy, A.S. ; Kulikov, A.N. ; Bachurin, V.I.
Vacuum. 193 (2021) - p. 110504 , 2021

Link: https://doi.org/10.1016/..

7

Energy Distributions of Secondary Charged Particles Sputter..:

Ieshkin, A. E. ; Tatarintsev, A. A. ; Kireev, D. S...
Technical Physics Letters. 47 (2021) 5 - p. 381-384 , 2021

Link: https://doi.org/10.1134/..

8

Angular Dependences of Silicon Sputtering by Gallium Focuse..:

Bachurin, V. I. ; Zhuravlev, I. V. ; Pukhov, D. E....
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 14 (2020) 4 - p. 784-790 , 2020

Link: https://doi.org/10.1134/..

9

Analyzing Products of the Electrochemical Exfoliation of Gr..:

Savinsky, N. G. ; Melesov, N. S. ; Parshin, E. O....
Bulletin of the Russian Academy of Sciences: Physics. 84 (2020) 6 - p. 732-735 , 2020

Link: https://doi.org/10.3103/..

10

Depth Profiling of Layered Si−O−Al Thin Films with Secondar..:

Bachurin, V. I. ; Melesov, N. S. ; Mironenko, A. A....
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 13 (2019) 2 - p. 300-305 , 2019

Link: https://doi.org/10.1134/..

11

Study of Multilayer Thin Film Structures by Rutherford Back..:

Bachurin, V. I. ; Melesov, N. S. ; Parshin, E. O...
Technical Physics Letters. 45 (2019) 6 - p. 609-612 , 2019

Link: https://doi.org/10.1134/..

12

Sputtering of Silicon and Silicon Dioxide by Low-Energy Ion..:

Bachurin, V. I. ; Izyumov, M. O. ; Amirov, I. I..
Bulletin of the Russian Academy of Sciences: Physics. 82 (2018) 2 - p. 127-130 , 2018

Link: https://doi.org/10.3103/..

13

Information Modeling in Systems Design of Carbon—Carbon Ele..:

Lysenko, V. A. ; Kriskovets, M. V. ; Bachurin, I. V..
Fibre Chemistry. 47 (2015) 3 - p. 177-182 , 2015

Link: https://doi.org/10.1007/..

14

Mössbauer studies of magnetite nanoparticles:

Shipilin, M. A. ; Zakharova, I. N. ; Shipilin, A. M..
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques. 8 (2014) 3 - p. 557-561 , 2014

Link: https://doi.org/10.1134/..

15

Computer simulation of the two-stage ion polishing of a sil..:

Birkgan, S. E. ; Bachurin, V. I.
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques. 8 (2014) 3 - p. 524-529 , 2014

Link: https://doi.org/10.1134/..