Bae, Yang-Ho
12668  results:
Search for persons X
?
1

Low-PBTS defect-engineered high-mobility metal-oxide BEOL t..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Bcltrando, Bastien ; Coppolelli, Bruno ; Kim, Jung-Bae... - p. 4A.2-1-4A.2-6 , 2024
 
?
2

Insights into device and material origins and physical mech..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
 
?
3

Analysis of the Role of Interfacial Layer in Ferroelectric ..:

Lee, Seongwon ; Kim, Haesung ; Yang, Hyojin...
IEEE Electron Device Letters.  45 (2024)  4 - p. 562-565 , 2024
 
?
4

An illustrated checklist of the tribe Nomophilini (Lepidopt..:

Lee, Tak-Gi ; Ko, Jae-Ho ; Kim, Hanul...
Journal of Asia-Pacific Biodiversity.  17 (2024)  2 - p. 334-342 , 2024
 
?
7

An annotated checklist of the Arctiinae of Korea (Lepidopte..:

Bayarsaikhan, Ulziijargal ; Ko, Jae-Ho ; Lee, Tak-Gi..
Journal of Asia-Pacific Biodiversity.  17 (2024)  1 - p. 125-132 , 2024
 
?
10

Gate Capacitance Coupling of Double-Gate Carbon Nanotube Ne..:

An, Yulim ; Lee, Hanbin ; Ko, Jeonghee...
ACS Applied Materials & Interfaces.  16 (2024)  5 - p. 6221-6227 , 2024
 
?
11

Exploring the Optimal Bit Pair for a Quantized Generator an..:

, In: 2023 IEEE International Conference on Visual Communications and Image Processing (VCIP),
 
?
12

Fowler–Nordheim Stress-Induced Degradation of Buried-Channe..:

Choi, Sungju ; Yang, Ga Won ; Lee, Sangwon...
IEEE Transactions on Electron Devices.  70 (2023)  1 - p. 48-52 , 2023
 
?
15

Analysis of a-InGaZnO TFT Threshold Voltage Instability and..:

Lee, Sangwon ; Park, Jingyu ; Yang, Ga Won...
IEEE Electron Device Letters.  44 (2023)  1 - p. 88-91 , 2023
 
1-15