Baek, Kyu-Ha
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1

Low-temperature solution-processed zinc oxide field effect ..:

Shin, Hyeonwoo ; Kang, Chan-mo ; Baek, Kyu-Ha...
Japanese Journal of Applied Physics.  57 (2018)  5S - p. 05GD04 , 2018
 
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2

Low-temperature, solution-processed indium-oxide thin-film ..:

Kim, Hoon ; Kang, Chan-mo ; Oh, Yeon-Wha...
Journal of the Korean Physical Society.  68 (2016)  8 - p. 971-974 , 2016
 
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3

Fabrication of low-loss optical interconnected waveguide us..:

Ryu, Jin Hwa ; Lee, Bong Kuk ; Baek, Kyu-Ha...
Journal of the Korean Physical Society.  65 (2014)  4 - p. 450-456 , 2014
 
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5

Stability characteristics of gallium-doped zinc-tin-oxide t..:

Lee, Jong Hoon ; Kim, Chang Hoi ; Kim, Hong Seung...
Journal of the Korean Physical Society.  62 (2013)  8 - p. 1176-1182 , 2013
 
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6

Poly(ethylene glycol)-Functionalized Photocurable Silsesqui..:

Lee, Bong Kuk ; Kim, Dong-Pyo ; Ryu, Jin-Hwa...
Japanese Journal of Applied Physics.  52 (2013)  6S - p. 06GG01 , 2013
 
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7

Siliconized silsesquioxane-based nonstick molds for ultrahi..:

Lee, Bong Kuk ; Park, Kun-Sik ; Kim, Dong-Pyo...
Journal of Materials Chemistry.  22 (2012)  33 - p. 16754 , 2012
 
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9

Metal∕Dielectric Liner Formation by a Simple Solution Proce..:

Ham, Yong-Hyun ; Kim, Dong-Pyo ; Baek, Kyu-Ha...
Electrochemical and Solid-State Letters.  15 (2012)  5 - p. H145 , 2012
 
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10

Characteristic Variations of Graphene Field-Effect Transist..:

Park, Jaehoon ; Park, Kun-Sik ; Jeong, Ye-Sul...
Japanese Journal of Applied Physics.  51 (2012)  8R - p. 081301 , 2012
 
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11

Cost-effective fabrication of submicron patterns under low ..:

Kim, Zin-Sig ; Park, Kun-Sik ; Baek, Kyu-Ha.
Journal of the Korean Physical Society.  61 (2012)  7 - p. 1088-1092 , 2012
 
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12

Nanopattern fabrication via AP-UVO exposure of a self-organ..:

Jeong, Ye-Sul ; Kim, Ah Ra ; Ham, Yong-Hyun...
Journal of the Korean Physical Society.  60 (2012)  3 - p. 501-504 , 2012
 
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13

Characteristic Variations of Graphene Field-Effect Transist..:

Park, Jaehoon ; Park, Kun-Sik ; Jeong, Ye-Sul...
Japanese Journal of Applied Physics.  51 (2012)  8R - p. 081301 , 2012
 
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