E-LIB Suche - Ergebnisse für: Baek, Rock-Hyun

1

Accurate Evaluation of Electro-Thermal Performance in Silic..:

Jeong, Jinsu ; Lee, Sanguk ; Baek, Rock-Hyun
Nanomaterials. 14 (2024) 12 - p. 1006 , 2024

Link: https://doi.org/10.3390/..

2

Current-Voltage Modeling of DRAM Cell Transistor Using Gene..:

Park, Jun Hui ; Kim, Jung Nam ; Lee, Seonhaeng...
IEEE Access. 12 (2024) - p. 23881-23886 , 2024

Link: https://doi.org/10.1109/..

3

Corrections to "Novel Trench Inner-Spacer Scheme to Elimina..:

Jeong, Jinsu ; Yoon, Jun-Sik ; Lee, Sanguk.
IEEE Transactions on Electron Devices. 71 (2024) 7 - p. 4437-4437 , 2024

Link: https://doi.org/10.1109/..

4

BCl3/Cl2 plasma etching process to fabricate a ferroelectri..:

Kang, Bohyeon ; Ahn, Sung-min ; Park, Jongseo...
Solid-State Electronics. 216 (2024) - p. 108918 , 2024

Link: https://doi.org/10.1016/..

5

Neural Network-Based prediction for Cross-Temperature induc..:

Cho, Kyeongrae ; Park, Chanyang ; Jang, Hyundong...
Solid-State Electronics. 217 (2024) - p. 108925 , 2024

Link: https://doi.org/10.1016/..

6

Analysis of Mechanical Stress on Fowler-Nordheim Tunneling ..:

Kim, Donghyun ; Nam, Kihoon ; Park, Chanyang...
Solid-State Electronics. 216 (2024) - p. 108927 , 2024

Link: https://doi.org/10.1016/..

7

Cryogenic Body Bias Effect in DRAM Peripheral and Buried-Ch..:

You, Hyunseo ; Nam, Kihoon ; An, Jehyun...
IEEE Access. 12 (2024) - p. 10988-10994 , 2024

Link: https://doi.org/10.1109/..

8

BS-PDN Implemented the Latest Logic Devices for 14 Angstrom..:

Lee, Junjong ; Seungchul Song, Stanley ; Baek, Rock-Hyun
IEEE Transactions on Electron Devices. 71 (2024) 7 - p. 4028-4032 , 2024

Link: https://doi.org/10.1109/..

9

Novel High-Speed Ternary Logic Using Step-Shaped Threshold ..:

Lee, Junjong ; Heo, Seongjae ; Hwang, Hyunsang.
IEEE Electron Device Letters. 44 (2023) 3 - p. 368-371 , 2023

Link: https://doi.org/10.1109/..

10

Investigation of Self-Heating Effect in Forksheet FETs for ..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),

Lim, Jaewan ; Jeong, Jinsu ; Lee, Junjong... - p. 1-3 , 2023

Link: https://doi.org/10.1109/..

11

Optimization of Ge Mole Fraction in Sacrificial Layers for ..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),

Lee, Sanguk ; Jeong, Jinsu ; Yoon, Jun-Sik... - p. 1-3 , 2023

Link: https://doi.org/10.1109/..

12

Investigation of Program Efficiency Overshoot in 3D Vertica..:

Park, Chanyang ; Yoon, Jun-Sik ; Nam, Kihoon...
Nanomaterials. 13 (2023) 9 - p. 1451 , 2023

Link: https://doi.org/10.3390/..

13

Curing Process on Passivation Layer for Backside-Illuminate..:

Park, Jongseo ; Choi, Kyeong-Keun ; An, Jehyun...
IEEE Access. 11 (2023) - p. 60660-60667 , 2023

Link: https://doi.org/10.1109/..

14

Novel Trench Inner-Spacer Scheme to Eliminate Parasitic Bot..:

Jeong, Jinsu ; Yoon, Jun-Sik ; Lee, Sanguk.
IEEE Transactions on Electron Devices. 70 (2023) 2 - p. 396-401 , 2023

Link: https://doi.org/10.1109/..

15

Enhancement of ISPP Efficiency Using Neural Network-Based O..:

Cho, Kyeongrae ; Yun, Hyeok ; Nam, Kihoon...
IEEE Transactions on Electron Devices. 70 (2023) 7 - p. 3504-3510 , 2023

Link: https://doi.org/10.1109/..