Baeumler, Martina
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Failure Analysis of 100 nm AlGaN/GaN HEMTs Stressed under O..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
 
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7

Spatial variations of carrier and defect concentration in V..:

Baeumler, Martina ; Börner, Frank ; Kretzer, Ulrich...
Journal of Materials Science: Materials in Electronics.  19 (2007)  S1 - p. 165-170 , 2007
 
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